Printer Friendly

Transmission Electron Microscope for material science.

The LaB6 Transmission Electron Microscope is for high-resolution imaging and analytical applications in the fields of materials, none-electronics, and biological sciences. With stability of both accelerating voltage and beam current, the JEM-2100 achieves a high resolution of 0.19 nm at 200 kV. The TEM attains high EDS count rates with high peak-to-background ratios due to its ability to achieve a high solid angle and large takeoff angle when equipped with a high-resolution polepiece and an optimally interfaced, large surface-area EDS detector. The JEM-2100 has three independent condenser lenses resulting in high probe currents for any given probe size. The newly designed goniometer stage achieves precise specimen movement at the nanometer scale. JEOL USA, Inc. www.jeol.com, 978-535-5900

Use InfoLINK 4L1112 or Call 800-369-0153

[ILLUSTRATION OMITTED]

COPYRIGHT 2004 Advantage Business Media
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004 Gale, Cengage Learning. All rights reserved.

Article Details
Printer friendly Cite/link Email Feedback
Title Annotation:Materials/Particle Characterization
Publication:Laboratory Equipment
Date:Nov 1, 2004
Words:127
Previous Article:Universal materials testing machines.
Next Article:Laboratory roller press for compaction testing.

Terms of use | Privacy policy | Copyright © 2021 Farlex, Inc. | Feedback | For webmasters |