Transmission Electron Microscope for material science.
The LaB6 Transmission Electron Microscope is for high-resolution imaging and analytical applications in the fields of materials, none-electronics, and biological sciences. With stability of both accelerating voltage and beam current, the JEM-2100 achieves a high resolution of 0.19 nm at 200 kV. The TEM attains high EDS count rates with high peak-to-background ratios due to its ability to achieve a high solid angle and large takeoff angle when equipped with a high-resolution polepiece and an optimally interfaced, large surface-area EDS detector. The JEM-2100 has three independent condenser lenses resulting in high probe currents for any given probe size. The newly designed goniometer stage achieves precise specimen movement at the nanometer scale. JEOL USA, Inc. www.jeol.com, 978-535-5900
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