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See in a whole new light.

Olympus Industrial America has launched LEXT, a new Confocal Laser Scanning Microscope designed for sub micron imaging, with outstanding 0.12m resolution and accurate three-dimensional measurement capability. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMS). LEXT combines a 408-nm laser with optics specifically designed for operation at this wavelength to optimize image quality and limit aberrations. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution.

Olympus Industrial America Inc.

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Title Annotation:New Products
Publication:R & D
Date:Oct 1, 2004
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