See in a whole new light.
Olympus Industrial America has launched LEXT, a new Confocal Laser Scanning Microscope designed for sub micron imaging, with outstanding 0.12m resolution and accurate three-dimensional measurement capability. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMS). LEXT combines a 408-nm laser with optics specifically designed for operation at this wavelength to optimize image quality and limit aberrations. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution.
Olympus Industrial America Inc.
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