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SII NanoTechnology to Release High-performance Fluorescent X-ray Film Thickness Meter.

Tokyo, Japan, May 13, 2006 - (JCN) - SII NanoTechnology has launched SFT9500, an advanced fluorescent x-ray film thickness-measuring device.

This model uses high-intensity x-ray irradiation to measure the thickness of thin and multiplayer membranes. It can also measure the composition of hazardous substances regulated by the RoHS and ELV Directives.

Supporting Microsoft Word and Excel in standard specifications, the new device facilitates data processing and analysis. The SFT9500 is useful in measuring various metal thin films used in semiconductors, electronic parts and printed circuit boards.

The product sells for 14,500,000 yen ($128,300).

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Publication:JCNN News Summaries
Date:May 14, 2006
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