SEM suited for sub-nanometer imaging.
JEOL's series of Field Emission Scanning Electron Microscopes (FE-SEM) offer expanded imaging and analysis capabilities customizable to performance requirements. The JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100 nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage. The microscope is a versatile, easy-to-use analytical field emission SEM that offers a high level of expanded performance. Through the in-lens field emission gun, the SEM delivers [greater than or equal to]200 nA of beam current to the sample. JEOL USA, Inc. www.jeolusa.com, 978-535-5900