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Articles from Printed Circuit Design & Fab Circuits Assembly (November 1, 2014)

1-21 out of 21 article(s)
Title Author Type Words
12 component properties no PCB library should lack: it all starts with the right part number--or numbers. Atar, Danit 866
3-day tech briefing details important new research. 179
A/V XLS. 160
Americas, PCB boost design software sales. 218
Are tight tolerances costing you money? Does a tighter tolerance guarantee superior quality and better function, or just a higher unit cost? Simon, Robert 1174
As PC sales lag, hp heads toward breakup. 207
At a loss: a nickel barrier layer prevents leaching of the silver base metallization layer. Hunt, Chris 383
Chasing the wild goose: or why the same guys who created the scrap probably aren't the best ones to fix it. Boguski, Robert 1535
Chipped out. Buetow, Mike Letter to the editor 812
Cost comparison of complex PCB fabrication using traditional sequential lamination methods vs. interconnect with conductive paste: conductive paste instead of microvias can lower drilling costs and scrap rates. Palesko, Chet A.; Palesko, Amy J.; Haley, James; Shearer, Catherine Reprint 2656
Developments allow shops to pursue new markets and improve margins. 344
Eliminating the 7 wastes throughout the production cycle: waste begins long before production starts. Barnes, Jim 1089
Fixing disorder in counterfeit mitigation: a newly defined EMS role would vastly improve counterfeit detection results. Fama, Joseph 1734
GHS timeline update. Mazur, Scott Chronology 1093
Global notebook shipments to increase 3% in 2015. 119
In case you missed it. 761
IPC recognizes contributors to electronics manufacturing standards. Buetow, Mike 577
Printing miniaturized devices for the automotive and industrial manufacturing sectors: a DoE investigates ways to extend the print process window for area ratios well below 0.66. Ashmore, Clive; Whitmore, Mark 2916
SMTAI keynote: data gluts hamper factories. Buetow, Mike 639
Subtraction by addition: why big mergers are not all they're cracked up to be. Bigelow, Peter 1082
Zero field failure enabled by Uyemura processes, support. 590

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