PRODUCTS: Keithley Adds Solar Cell Test Libraries to KTEI V7.2 Update.
Keithley Instruments Inc. has introduced a variety of hardware, firmware, and software enhancements to its Semiconductor Characterization System, including new solar cell test libraries.Also included in the Keithley Test Environment Interactive (KTEI) V7.2 upgrade: an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability and support for the company's new nine-slot Model 4200-SCS instrument chassis.
The new solar cell test libraries included in KTEI V7.2 expand the Model 4200-SCS's capabilities for solar cell I-V, C-V, and resistivity testing applications. The software upgrade also supports Drive-Level Capacitance Profiling (DLCP), a new solar cell testing technique that was difficult to perform accurately using earlier test solutions.
DLCP provides defect density information on thin film solar cells. Existing Model 4200-CVU Capacitance-Voltage Unit cards, which were introduced in November 2007, can be readily modified to support this testing technique.
For more information on KTEI V7.2, visit www.keithley.com/products/semiconductor/?mn=4200-SCS.
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|Date:||Mar 20, 2009|
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