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On-line testing symposium; proceedings.

9780769532646

On-line testing symposium; proceedings.

International On-Line Testing Symposium (14th: 2008: Rhodes, Greece)

Computer Society Press

2008

305 pages

$190.00

Paperback

TK7867

This proceedings collects approximately 55 papers presented at the 14th IEEE online testing symposium held in Rhodes, Greece in July 2008, discussing software engineering topics for electronic testing. The editors (associated with Y. of Athens and U. of Piraeus, Greece; TIMA laboratory, France; and Intel) present the articles under the following themes: online error detection and correction, self-checking circuits and error detecting codes, radiation hardening techniques, soft error detection and correction methodologies, control-flow checking and fault-tolerance in special applications, fault injection, benchmarking and standardization in software-based SER characterization, mitigation techniques for transient errors, memory self-test and self-repair, posters, reliability and circuit stimulation, networks-on-chip and labs-on-chip, parametric testing techniques, radiation-induced SER, self-test generation techniques, and laser-based fault injection in memories. This book contains an author index only.

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Publication:SciTech Book News
Article Type:Book review
Date:Sep 1, 2008
Words:156
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