Printer Friendly

On-line testing symposium; proceedings.

9780769529189

On-line testing symposium; proceedings.

International On-Line Testing Symposium (13th: 2007: Crete, Greece) Ed. by Dimitris Gizopoulos et al.

Computer Society Press

2007

300 pages

$201.00

Paperback

TK7867

These proceedings feature 56 articles from the 13th IEEE International On-Line Testing Symposium held in Heraklion, Crete, Greece, in July of 2007. In addition to a summary of the tutorial (part of the IEEE Computer Society Test Technology Technical Council Test Technology Educational Program) and keynote and invited talks, sessions, posters, and panels cover such topics as reliability issues in nanometer technologies, network-on-chip reliability, fault tolerance, secure systems, large scale dependability, and the dependability of processors. Other coverage is of SoCs and asynchronous circuits, aging and wearout issues and mitigation approaches, radiation effects, signal integrity and error compensation, SER trends, fault tolerance, on-line and processor- based testing, and self-checking and self-testing. Only an author index is provided.

([c]20072005 Book News, Inc., Portland, OR)
COPYRIGHT 2007 Book News, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2007 Gale, Cengage Learning. All rights reserved.

Article Details
Printer friendly Cite/link Email Feedback
Publication:SciTech Book News
Article Type:Book Review
Date:Sep 1, 2007
Words:153
Previous Article:Broca's region.
Next Article:The archive of place; unearthing the pasts of the Chilcotin Plateau.


Related Articles
On-line testing symposium (IOLTS 2005); proceedings.
Defect and Fault Tolerance in VLSI Systems; proceedings.
Exotic Nuclear Systems: Proceedings.
On-Line Testing Symposium: Proceedings.
Asynchronous circuits and systems; proceedings.
European test symposium; proceedings.
VLSI test symposium; proceedings.
Asian test symposium; proceedings.
On-line testing symposium; proceedings.
European test symposium; proceedings.

Terms of use | Privacy policy | Copyright © 2021 Farlex, Inc. | Feedback | For webmasters |