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On-line testing symposium; proceedings.


On-line testing symposium; proceedings.

International On-Line Testing Symposium (13th: 2007: Crete, Greece) Ed. by Dimitris Gizopoulos et al.

Computer Society Press


300 pages




These proceedings feature 56 articles from the 13th IEEE International On-Line Testing Symposium held in Heraklion, Crete, Greece, in July of 2007. In addition to a summary of the tutorial (part of the IEEE Computer Society Test Technology Technical Council Test Technology Educational Program) and keynote and invited talks, sessions, posters, and panels cover such topics as reliability issues in nanometer technologies, network-on-chip reliability, fault tolerance, secure systems, large scale dependability, and the dependability of processors. Other coverage is of SoCs and asynchronous circuits, aging and wearout issues and mitigation approaches, radiation effects, signal integrity and error compensation, SER trends, fault tolerance, on-line and processor- based testing, and self-checking and self-testing. Only an author index is provided.

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Publication:SciTech Book News
Article Type:Book Review
Date:Sep 1, 2007
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