Printer Friendly

New Market Report: Global Thin Film Metrology Systems Market 2015-2019.

[ClickPress, Mon Feb 02 2015] Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

TechNavio's analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

Covered in this Report

This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

Full Report Details at

- http://www.fastmr.com/prod/952129_global_thin_film_metrology_systems_market.aspx?afid=301

* ODMs

* OEMs

* Foundries

Key Region s

* Americas

* APAC

* EMEA

Key Vendors

* KLA-Tencor

* Nanometrics

* Nova Measuring Instruments

* Rudolph Technologies

Other Prominent Vendors

* Hitachi High-Technologies

* SCREEN Holdings

* Semilab

Key Market Driver

* Increased Level of Complexity in ICs

* For a full, detailed list, view our report

Key Market Challenge

* Cyclic Nature of Semiconductor Industry

* For a full, detailed list, view our report

Key Market Trend

* Increasing Demand for Integration and Miniaturization of Semiconductor Devices

* For a full, detailed list, view our report

Key Questions Answered in this Report

* What will the market size be in 2019 and what will the growth rate be?

* What are the key Market Trend s?

* What is driving this market?

* What are the challenges to market growth?

* Who are the Key Vendors in this market space?

* What are the market opportunities and threats faced by the Key Vendors?

* What are the strengths and weaknesses of the Key Vendors?

Research methodology is based on extensive primary and secondary research. Primary research includes in-depth interviews with industry experts, vendors, resellers and customers. Secondary research includes Technavio Platform, industry publications, company reports, news articles, analyst reports, trade associations and the data published by Government agencies.

Companies Mentioned in this Report: KLA-Tencor, Nanometrics, Nova Measuring Instruments, Rudolph Technologies, Hitachi High-Technologies, SCREEN Holdings, Semilab

About Fast Market Research

Fast Market Research is a leading distributor of market research and business information. Representing the world's top research publishers and analysts, we provide quick and easy access to the best competitive intelligence available. Our unbiased, expert staff is always available to help you find the right research to fit your requirements and your budget.

For more information about these or related research reports, please visit our website at http://www.fastmr.com or call us at 1.800.844.8156.

You may also be interested in these related reports:

- Global Thin Film Metrology Systems Market 2014-2018

- Global Optical Metrology Market 2014-2018

- Medical Robots Market - Global Forecasts to 2018

- Thin Film Material Market - Global Trends & Forecast to 2018

- Solar PV Module Value Chain - Market Size, Average Price, Market Share and Key Country Analysis to 2020

Copyright 2014 ClickPress Provided by SyndiGate Media Inc. ( Syndigate.info ).
COPYRIGHT 2015 SyndiGate Media Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2015 Gale, Cengage Learning. All rights reserved.

Article Details
Printer friendly Cite/link Email Feedback
Publication:ClickPress
Date:Feb 2, 2015
Words:544
Previous Article:Report Published: "Australia Insurance Report Q2 2015".
Next Article:Electronic Stability Control (ESC) Market in Europe 2015-2019 - New Study Released.
Topics:

Terms of use | Privacy policy | Copyright © 2019 Farlex, Inc. | Feedback | For webmasters