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1-27 out of 27 article(s)
Title Author Type Date Words
Geoelectrical Investigations at Three Bridge Sites North Nyala Southern Darfour State West-Sudan. Report Dec 31, 2014 3568
Indirect measurement of motor current derivatives in PMSM sensorless drives. Jarzebowicz, L. Report Jul 1, 2014 2676
Developing a new low loss and accurate current measurement technique in ac drive motors. Esmaeli, Abdolreza; Rahbar, Mohammad Report Jun 1, 2014 2964
Estimation of on-fly phase resistance of on 8/6 switched reluctance motor for sensorless control. Hrbac, R.; Mlcak, T.; Kolar, V.; Necas, J. Report May 1, 2014 3907
A comparison between analytical solutions for lightning-induced voltage calculation. Andreotti, A.; Assante, D.; Pierno, A.; Rakov, V.A.; Rizzo, R. Report May 1, 2014 3058
Numerical analysis of electric field in three-electrode corona system containing ionized and non-ionized areas. Barciauskas, R.; Marciulionis, P.; Zebrauskas, S. Report May 1, 2014 3917
Influence of emitted electrons on the method for direct measurement of condensate resistance. Jukna, T.; Sinkevicius, V.; Urbanaviciute, L. Report Feb 1, 2014 2375
An adaptive estimation scheme for open-circuit voltage of power lithium-ion battery. Zhang, Yun; Zhang, Chenghui; Cui, Naxin Report Jan 1, 2014 2837
Transmission line protection and fault location based on travelling wave measurement. Siozinys, V.; Urniezius, R. Report Sep 1, 2013 2436
Effect of terminating resistance on high frequency behaviour of Rogowski coil for transient measurements. Shafiq, M.; Lehtonen, M.; Kutt, L.; Hussain, G.A.; Hashmi, M. Report Jul 1, 2013 4018
Induction coupling between jointless track circuits and track-circuit-reader antenna. Zhao, Lin-Hai; Shi, Wei-Shi Report Jun 1, 2013 6869
Using microcontrollers for high accuracy analogue measurements. Jaanus, M.; Udal, A.; Kukk, V.; Umbleja, K. Report Jun 1, 2013 2072
Eddy current rail inspection using AC bridge techniques. Liu, Ze; Koffman, Andrew D.; Waltrip, Bryan C.; Wang, Yicheng Report Mar 1, 2013 3990
A new open cavity at millimeter wave band for permittivity measurement of dielectrics. Dou, Wenbin; Xiang, Bo Report Feb 1, 2013 2776
Reliable and damage-free estimation of resistivity of ZnO thin films for photovoltaic applications using photoluminescence technique. Poornima, N.; Vimalkumar, T.V.; Rajeshmon, V.G.; Kartha, C. Sudha; Vijayakumar, K.P. Report Jan 1, 2013 5398
An improved nonlinear five-point model for photovoltaic modules. Dongue, Sakaros Bogning; Njomo, Donatien; Ebengai, Lessly Report Jan 1, 2013 6046
Evaluation of lightning return stroke current using measured electromagnetic fields. Izadi, M.; Ab Kadir, M.Z.A.; Gomes, C.; Cooray, V. Report Aug 1, 2012 5318
Supply voltage quality in low voltage industrial networks of Estonia/Toitepinge kvaliteet Eesti toostuslikes madalpingevorkudes. Vinnal, Toomas; Janson, Kuno; Jarvik, Jaan; Kalda, Heljut; Sakkos, Tiiu Report Jun 1, 2012 6849
Experimental measurement method to determine the permittivity of extra thin materials using resonant metamaterials. Xu, S.; Yang, L.; Huang, L.; Chen, H.S. Report Oct 1, 2011 3064
Filter for intermodulation distortion measurement of audio power amplifiers/Filtras garso galios stiprintuvu tarpmoduliaciniams iskraipymams matuoti. Puidokas, V.; Marcinkevicius, A.J. Report Aug 1, 2011 2012
Robust piezo impedance magnitude measurement method/Pjezoelemento impedanso vertes matavimo metodas. Saar, T. Report Jul 1, 2011 1990
Impedance measurements of nonuniform transmission lines in time domain using an improved recursive multiple reflection computation method. Liu, Y.; Tong, L.; Zhu, W.-X.; Tian, Y.; Gao, B. Report Jul 1, 2011 4700
Impedance measurement of millimeter wave metamaterial antennas by transmission line stubs. Sajin, G.I. Report Jun 1, 2011 2685
Electrical resistivity measurements in sensitive periglacial environment from Southern Carpathians (Romania). Onaca, Alexandru Lucian; Urdea, Petru; Torok-Oance, Marcel Francisc; Ardelean, Florina-Minodora Report Jan 1, 2011 1639
A comparison of methods for computing the residual resistivity ratio of high-purity niobium. Splett, J. D.; Vecchia, D. F.; Goodrich, L. F. Report Jan 1, 2011 7253
Fundamentals of semiconductor C-V measurements. Stauffer, Lee Dec 1, 2008 1661
Determination of near-surface apparent resistivity by means of high frequency mutual impedance measurements. Beziuk, Grzegorz; Mydlikowski, Remigiusz Report Oct 1, 2007 3522

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