Printer Friendly

Browse Mensuration topic

Methods subtopic


1-37 out of 37 article(s)
Title Author Type Date Words
X-ray Metrology for the Semiconductor Industry Tutorial. Sunday, Daniel F.; Wu, Wen-li; Barton, Scott; Kline, R. Joseph Jan 1, 2019 943
Leveraging Smart Meter Data & Expanding Services. Franconi, Ellen; Jump, David Sep 1, 2017 3712
Measuring poverty over time. Christiaensen, Luc; Telfer-Taivainen, Lorraine Aug 1, 2012 1281
The precise measurement of car velocity. Barzdziukas, Julius; Augutis, Stasys Vygantas; Zilinskas, Rimvydas Povilas Report Jun 1, 2012 3112
How to measure the world's technological capacity to communicate, store, and compute information Part I: results and scope. Hilbert, Martin; Lopez, Priscila Report Apr 27, 2012 9583
How to measure the world's technological capacity to communicate, store, and compute information Part II: measurement unit and conclusions. Hilbert, Martin; Lopez, Priscila Report Apr 27, 2012 9368
How to measure "how much information"? Theoretical, methodological, and statistical challenges for the social sciences. Hilbert, Martin Report Apr 27, 2012 6123
Measurement system of fuel consumption for diesel engine based on function link neural network/Dyzelinio variklio degalu suvartojimo matavimo sistema, pagrista neuroniniu tinklu funkciniais rysiais. Wen-hua, Yuan; Yu-mei, Liu Report Jul 1, 2011 3297
Optimal adhesion measuring methods of the glass fibre reinforcement layer/Komposiidi klaaskiud-tugevduskihi nakkuvuse mootmise meetodid. Karjust, Kristo; Pohlak, Meelis; Majak, Juri Report Dec 1, 2010 2628
Best practices. Jul 1, 2010 944
Measurement of absorption and scattering with an integrating sphere detector: application to microalgae. Gaigalas, A. K.; He, Hua-Jun; Wang, Lili Report Mar 1, 2009 6791
Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient standard reference material. Lu, Z.Q.J.; Lowborn, N.D.; Wong-Ng, W.; Zhang, W.; Thomas, E.L.; Otani, M.; Green, M.L.; Tran, T.N.; Report Jan 1, 2009 8077
Different methods of measuring gauge rings. Tasic, Tadej; Acko, Bojan; Godina, Andrej; Brajlih, Tomaz Report Jan 1, 2009 919
Measuring the technology diffusion from multinational enterprises. Elmawazini, Khaled Sep 1, 2008 815
Approaches to Measuring and Understanding Employer Training Expenditure. Smith, Andrew; Burke, Gerald; Long, Michael; Dumbrell, Tom Author abstract Jan 1, 2008 449
When is an ounce not an ounce? Nelson, Steve Brief article Jan 1, 2008 128
Computation of available transfer capability using neural network. Rao, K. Narasimha; Kumar, K. Kiran; Amarnath, J.; Kamakshaiah, S. Report Jan 1, 2008 5411
Ventilation effectiveness criteria and measurement methods applicable to animal buildings--a review. Jerez, Sheryll B.; Zhang, Yuanhui; Wang, Xinlei Jan 1, 2007 9709
Prof. Sleuth's bag of tricks--5 Enterprise Metrology steps. Column Dec 1, 2006 1032
Measuring up. Kennedy, Ryan D. Jul 1, 2006 721
Hedonic and matched-model index issue: weights. Brief Article Jan 1, 2006 265
Metrology for lean manufacturing: EM Sleuth's enterprise metrology self-assessment guide (the short form). Woodbine, Ken; Logee, Steve; Fabiano, Rob; Cassola, Joel Dec 1, 2005 1419
Surface metrology may add some pages. Hutchinson, Harry Brief Article Aug 1, 2005 225
How to gauge sensor noise in closed-loop AFMs. Cleveland, Jason Jul 1, 2005 318
Measuring small. Collins, Gary Mar 1, 2005 2669
Calculating partial arcs. Rose, Steve Aug 1, 2004 657
How should we measure patient satisfaction? Tarantino, David P. Jul 1, 2004 766
Student-Centered Reliability, Concurrent Validity and Instructional Sensitivity in Scoring of Students' Concept Maps in a University Science Laboratory. Kaya, Osman Nafiz; Kilic, Ziya Report Jan 1, 2004 255
A new method for dynamic MEMS metrology: though the popularity of microelectromechanical systems (MEMS) has soared, manufacturers are still confronted with the need to determine how their products will perform once they are pressed into service. A novel metrology method may yield promising new results. Zecchino, Mike; Novak, Erik Jun 1, 2003 1023
Moving mountains: Everest's height was first determined in 1847 and despite some significant advances in technology, the accepted figure has changed remarkably little. May 1, 2003 827
The fingerprint approach: using data generated by a 2-axis log scanner to accomplish traceability in the sawmill's log yard. Chiorescu, Sorin; Berg, Per; Gronlund, Anders Feb 1, 2003 7624
Measurements conducted with X-Ray Calibration Interferometer. (News Briefs). Brief Article Mar 1, 2002 266
NIST demonstrates quantum-mechanically-entangled, spin-squeezed states. (News Briefs). Brief Article Sep 1, 2001 204
Mathematics and measurement. Rust, Bert W. Jan 1, 2001 12439
Pro tips for successful measuring and marking. Gorton, Jeff May 1, 1998 1078
Do look now, for the metric system is coming. Levitan, Donald Oct 1, 1993 956
On the use of period-average stumpage prices to estimate forest asset pricing models. Washburn, Courland L.; Binkley, Clark S. Nov 1, 1990 6239

Terms of use | Privacy policy | Copyright © 2019 Farlex, Inc. | Feedback | For webmasters