Printer Friendly

Marubeni Solutions Corporation Will Market and Distribute n&k Technology's Optical Scatterometry/Thin Film Metrology Systems in Japan.

SANTA CLARA, Calif. & TOKYO -- n&k Technology, Inc., Santa Clara, California and Marubeni Solutions (MSOL) Corporation, Tokyo, Japan announced today that Marubeni Solutions Corporation will have exclusive rights to market and distribute n&k Technology's products in Japan.

n&k Technology, Inc., founded in 1992, manufactures optical scatterometry/thin film metrology systems for the semiconductor, photomask, flat panel display and data storage industries. These ultra-high resolution tools are able to address the metrology challenges of the 45 nm technology node and beyond by simultaneously and accurately measuring film thickness, n and k, trench and via depths, CDs and profiles. Phase-shift of Photomasks is also determined. The core technology of n&k is based on DUV-Vis-NIR broadband polarized spectrophotometry with patented reflective optics, in conjunction with the Forouhi-Bloomer dispersion equations and Rigorous Coupled Wave Analysis. n&k Technology's field-proven, production-worthy systems have been installed at worldwide customer sites, including the United States, Japan, Korea, Singapore, Taiwan, China, Germany and the United Kingdom. Visit n&k Technology's website at

Marubeni Solutions Corporation (MSOL) headquartered in Tokyo, Japan, is a leader in the introduction of advanced technology products into Japan and Asia from all over the world. The company's main business is sales, consulting, maintenance/technical servicing and import/export of systems including electrical devices, high tech equipment, network systems and CAD/CAM/CAE systems. For more information, see

Marubeni Solutions will provide sales, service, installation support and spare parts inventory for n&k Technology's customers in Japan. In addition to manufacturing and new product development, n&k Technology will provide technical support and training.

"With Marubeni's proven capabilities, we look forward to excellent product support, as well as growth of n&k's installed base in Japan," stated Dr. Rahim Forouhi, the CEO and president of n&k Technology.

Shigeyuki Tabata, General Manager of FAB Solutions Department of Marubeni Solutions, said, "It is very exciting to be engaged in a business relationship with n&k Technology and to market its excellent products in Japan. We anticipate a long-lasting and very successful partnership."
COPYRIGHT 2006 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2006, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Article Type:Company overview
Date:Oct 5, 2006
Previous Article:Spirit Airlines Reports September 2006 Traffic.
Next Article:ClientLogic Partners With Helio To Ramp Up Customer Care.

Related Articles
Nanometrics Sues Nova Measuring Instruments for Patent Infringement.
Accent Debuts Scatterometry Acceleration Tool - Matchbox(TM); Advancing CD Metrology for 65nm Device Production and Beyond.
n&k Technology Introduces Ultra-Small Footprint Optical Scatterometry/Thin Film Metrology Tool; See n&k's ''LittleFoot(TM)'' in Booth #6157 North...
Timbre Technologies, Inc., a TEL company, Announces another Mask Shop Adoption of ODP-M by TSMC.
Nanometrics and ASML Enter Into Cross-Licensing Agreement for Advanced Overlay and CD Control Metrology Technology.
Nanometrics Files New Complaint Against Nova Measuring Instruments for Patent Infringement.
Jordan Valley Partners with OpenDream to Penetrate Korean Semiconductor Market.
Marubeni Solutions Corporation Obtains Repeat Order for n&k Technology's 300 mm CVD Metrology System.
Nanometrics Announces Settlement of Nova Measuring Patent Litigation.
Nanometrics Announces Global Manufacturing Center for Overlay Metrology.

Terms of use | Privacy policy | Copyright © 2018 Farlex, Inc. | Feedback | For webmasters