Leading NIST publication cited. (General Developments).
The paper, "GaAs Spin Polarized Electron Source," was written by NIST staff members in 1980. It was the first in a series of papers that developed the measurement technology for the control and measurement of the electron spin in electron beams. Subsequently, a number of measurement methods involving the spin of free electrons were developed by NIST and applied to magnetic surfaces and films. One of these methods, SEMPA, is a type of electron microscopy used to image nanoscale magnetic domains. It has been applied productively in studies of magnetic disk storage systems, magnetic sensors, and most recently, to nanoscale magnetic random-access memory devices.
The GaAs source began the resurgence of research into spin-polarization effects tat has continued to this day. There is active work worldwide on magnetic nanodevices, magnetoelectronics, and spintronics--all of which can potentially shape the future of electronics and information technology.
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|Publication:||Journal of Research of the National Institute of Standards and Technology|
|Article Type:||Brief Article|
|Date:||Jul 1, 2002|
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