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Articles from Journal of Research of the National Institute of Standards and Technology (January 1, 2019)

1-13 out of 13 article(s)
Title Author Type Words
A Black-Box Noninvasive Characterization Method for Industrial Wireless Networks. Kashef, Mohamed; Candell, Richard; Lee, Kang 7518
A Reference Schema for the Unit Manufacturing Process Information Model. Bernstein, William Z.; Lechevalier, David Technical report 2126
Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition Processes. Maslar, James E.; Kimes, William A.; Sperling, Brent A. Technical report 7791
Comparison of Models for Heat Transfer in High-Density Fibrous Insulation. Carvajal, Sergio A.; Garboczi, Edward J.; Zarr, Robert R. Report 7405
Design, Manufacturing, and Inspection Data for a Three-Component Assembly. Hedberg, Thomas D., Jr.; Sharp, Michael E.; Maw, Toby M.M.; Rahman, Mostafizur M.; Jadhav, Swati; Wh 1041
Fatigue Testing of Pipeline Welds and Heat-Affected Zones in Pressurized Hydrogen Gas. Drexler, Elizabeth S.; Slifka, Andrew J.; Amaro, Robert L.; Sowards, Jeffrey W.; Connolly, Matthew J Technical report 9101
Hydrogen-Deuterium Exchange Mass Spectrometry (HDX-MS) Centroid Data Measured between 3.6[degrees] C and 25.4[degrees] C for the Fab Fragment of NISTmAb. Hudgens, Jeffrey W.; Gallagher, Elyssia S.; Karageorgos, Ioannis; Anderson, Kyle W.; Huang, Richard Technical report 4077
interlab: A Python Module for Analyzing Interlaboratory Comparison Data. Sheen, David A. 752
Proceedings of the First Workshop on Standards for Microfluidics. Reyes, Darwin R.; van Heeren, Henne 9844
pyLLE: A Fast and User Friendly Lugiato-Lefever Equation Solver. Moille, Gregory; Li, Qing; Lu, Xiyuan; Srinivasan, Kartik Report 4662
Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis. Levine, Zachary H.; Blattner, Timothy J.; Peskin, Adele P.; Pintar, Adam L. Correction notice 11598
Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane. Laesecke, Arno; Junker, Clemens; Lauria, Damian S. Technical report 24536
X-ray Metrology for the Semiconductor Industry Tutorial. Sunday, Daniel F.; Wu, Wen-li; Barton, Scott; Kline, R. Joseph 943

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