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Inline 3-D SPI.

VP5000 is said to have 12 [micro]m resolution with a 23 x 31 mm field of view. Includes warning thresholds to the pass/fail outputs. Interfaces with Qup-Navi software for height calculations and volumetric inspection. Uses color stripe phase shift method. Combines red-green-blue light sources and a 3-CCD camera with texture mapping or gradation displays. Inspects for average height, volume, excessive deposition, insufficient solder, smearing, misalignment and bridging. Displays defective pad locations on the substrate map with up to eight raw images of defective pads. Handles substrates from 2" x 2" to 18" x 20". Omron Electronics,

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Publication:Circuits Assembly
Date:Nov 1, 2008
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