IMPROVED MEASUREMENT SYSTEM FOR INFRARED PROPERTIES OF MATERIALS.
The instrument uses a precision goniometer and has a Fourier-transform infrared (FTIR) spectrophotometer as a source. The system can measure variable angle absolute reflectance and transmittance from 12[degrees] (and 0[degrees]) to [greater than]80[degrees], over the 1 [micro]m to 5[micro]m wavelength range with an expanded (k = 2) uncertainty of 0.002. Improvements to the new measurement system are underway: the wavelength range will be expanded to 20 [micro]m and IR ellipsometry measurement capability will be established. These improvements are expected to improve the accuracy in the determination of IR optical constants of opaque materials.
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|Publication:||Journal of Research of the National Institute of Standards and Technology|
|Article Type:||Brief Article|
|Date:||Nov 1, 2000|
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