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Feinfocus, Palomar collaborate.

FeinFocus USA (Stamford, CT, and Palomar Technologies (Vista, CA, have teamed to address the manufacturing challenges of the optoelectronics, microelectromechanical systems (MEMS)/micro-optoelectromechanical systems (MOEMS) and radio frequency (RF) components markets. Palomar's Process Development and Prototyping Services (PDPS) will use the Feinfocus FOX-160.25MFT x-ray inspection system for the inspection of advanced components, materials and packaging technologies. The companies will also publish joint technical papers on their findings with regards to process development, testing and manufacturing of optoelectronics and micro-mechanical components and assemblies.

Palomar Technologies is a supplier of equipment used in component development and assembly. The relationship with Feinfocus will give Palomar the ability to conduct real-time inspection of assemblies that include chip-on-board, bond wires, ball grid array (BGA), microBGA and flip chip components, as well as other applications where precise measurement is required. The Feinfocus inspection system offers sub-micron defect detection and a small focal spot size.
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Title Annotation:Industry News
Publication:Circuits Assembly
Article Type:Brief Article
Geographic Code:1USA
Date:Aug 1, 2003
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Next Article:Legacy Electronics gets 3-D memory module patent.

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