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FT-IR imaging system. (Instruments).

The Spectrum Spotlight 300 IR imaging system features patented Duet detector technology that is said to overcome the limitations of traditional FT-IR imaging systems and provides scientists more complete chemical information to solve problems faster, according to the company. Spectrum Spotlight is said to set new standards for sensitivity, speed and flexibility, making it ideal for analytical services and surface science labs who wish to complement their existing imaging techniques, such as scanning electron microscopy, with a source of high-quality molecular information. Spotlight is said to feature simple set-up, fast data collection, advanced graphics and innovative technology, according to the company. The Duet detector technology is said to eliminate the need for difficult, time-consuming step-scan data collection. Operating over a wider wavelength range, the Duet detector provides state-of-the-art FT-IR microscopy capabilities and faster imaging, which makes it applicable to an extended range of applications, according to the company. (PerkinElmer Instruments)

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Publication:Rubber World
Article Type:Brief Article
Date:Dec 1, 2001
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