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FIRST NANO 4000 FILM THICKNESS MEASUREMENT SYSTEM SHIPPED

 FIRST NANO 4000 FILM THICKNESS MEASUREMENT SYSTEM SHIPPED
 SUNNYVALE, Calif., Aug. 13 /PRNewswire/ -- Nanometrics Inc. (NASDAQ/NMS: NANO) announced today that it has shipped its first Model 4000 Automated Film Thickness Measuring System to a U.S. semiconductor company. The Model 4000 was announced in June and is one of the first products in its field to incorporate IBM's new OS/2 version 2.0 486 microcomputer operating system which allows multi-tasking (simultaneous computer operations) to take place. It can measure film thicknesses in a 3 micron spot from 20 to 400,000 Angstroms. This provides speedier results and allows a large number of separate system functions to be performed automatically as the measurement cycle takes place including stage motion, autofocus, thickness calculation and mapping.
 The Model 4000 is the latest model of the company's series of NanoSpec(R)/AFT Automatic Film Thickness Measuring Systems. More than 3,000 of these systems have been shipped to semiconductor companies for quality control in the last 15 years. The 4000 allows host computer control, data-logging, simultaneous operation of a number of key internal systems, and window access to programs and files for easier engineering setup and operation. The OS/2 system allows programming of a wide range of parameters to enhance algorithm development for new film measurement applications. The company expects it to find wide use in quality control by manufacturers of semiconductor chips, magnetic heads, flat panel displays and other transparent thin film devices which require a no-touch, non-destructive measurement method. Many older NanoSpec/AFT systems are upgradable to the new software concept, improving their accuracy, lengthening their life and broadening their use at modest cost.
 New Model 4000's will be available in several versions, including a UV scanning and film uniformity mapping for wafers up to 200 mm diameter. Prices will range from $70,000 to $140,000 depending on automation features.
 Nanometrics' products include automated optical microscope-based film thickness measurement and inspection stations used in the manufacture of semiconductors. Nanometrics is traded on the NASDAQ National Market System under the symbol NANO.
 -0- 8/13/92
 /CONTACT: Vincent J. Coates or William Turnquist of Nanometrics, 408-746-1600/
 (NANO) CO: Nanometrics Inc. ST: California IN: CPR SU: PDT


DG-TB -- SJ006 -- 9810 08/13/92 19:24 EDT
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Date:Aug 13, 1992
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