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Electronic design, test and applications; proceedings.

0769525008

Electronic design, test and applications; proceedings.

International Workshop on Electronic Design, Test and Applications (3d: 2006: Kuala Lumpur, Malaysia)

IEEE Press

2006

521 pages

$215.00

Paperback

TK7874

The proceedings of the January 2006 workshop consists of 62 full papers and 33 posters on electronic design techniques, signal and image processing, synthesis, optimization, communications, and networking. Special sessions address diagnostics for deep submicron technologies, industrial and practical test engineering, electronics education, electromagnetic sensors, microphotonics, and defect and fault tolerance. Topics include the electrical behavior of a GOS fault affected domino logic cell, static code analysis of functional descriptions in SystemC, a reconfigurable embedded decompressor for test compression, and distributed wireless optical communications for humanitarian assistance in disasters. No subject index is provided.

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Publication:SciTech Book News
Article Type:Book Review
Date:Mar 1, 2006
Words:130
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