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Articles from EE-Evaluation Engineering (January 1, 2009)

1-18 out of 18 article(s)
Title Author Type Words
266-MHz system tests MCP/flash devices. Brief article 152
ATE platform tests both flash and DRAM. Brief article 155
Can you really measure 154.263 ps? Lecklider, Tom 3885
Company guide. Directory 950
Conducted Susceptibility Testing. Ferguson, Steven G. 1804
Enhanced platform simplifies I-V characterization. Brief article 158
LXI Class C digitizers provide scope-like measurements. Brief article 159
Module combines JTAG/boundary scan and functional test. Brief article 155
Multifunction board handles embedded applications. Brief article 155
Portable scopes feature bandwidths up to 200 MHz. Brief article 145
Redefining memory test. West, Scott 2633
Selecting your optimum LXI feature set. Schreier, Paul 2149
Services guide. List 2840
Software addresses challenge of memory management in C. Brief article 139
Stressed-out data buses. Lecklider, Tom 2769
To help you stay informed. Milo, Paul Editorial 560
Two LXI chassis accept 3U switching modules. Brief article 148
USB 3.0 physical layer measurements. Engbretson, Mike 1905

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