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Articles from EE-Evaluation Engineering (October 1, 2008)

1-13 out of 13 article(s)
Title Author Type Words
An alternative to sigma clipping in shaker testing. Steinwolf, Alexander 3358
Diagnostic tools developed for mixed-signal cards. Brief article 129
Exploring AOI and X-Ray. Miller, Don 2452
Extended analyzer capabilities blur distinctions. Lecklider, Tom 3071
Fault injection for non-boundary scan devices. Satourian, Vaheh 1193
It's fast and mostly green. Milo, Paul Editorial 529
Plug-in cards expand Switch/Multimeter line. Brief article 136
Satellite testing demands RF link emulation. Cagney, Michael 1636
Scopes provide quick access to all controls. Brief article 130
Single-output power supplies include security features. Brief article 133
Systems EMC design and analysis. Brewer, Ron 2081
Tackling next-generation RF SOC test. Burke, Ron 2577
The drive for improved performance. Lecklider, Tom 3090

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