Printer Friendly

Articles from EE-Evaluation Engineering (November 1, 2007)

1-16 out of 16 article(s)
Title Author Type Words
14-slot chassis designed for rugged applications. 134
Analog signal generators updated. Lecklider, Tom 3777
Another student Design Contest. Milo, Paul Editorial 554
Applying Kelvin measurements to PMIC testing on ATE. Luehman, Kent 2136
CuBe is still relevant for EMI shielding. Gedeon, Mike; Finneran, Kevin 2754
ESD Simulator. 111
Evolution of clean-room ionization. Gorczyca, John; Peirce, Roger J.; Williford, Brad 1261
Is your accuracy being degraded? Lantz, Paul; Sheffer, Tee 2222
Next-generation RF device test performance challenges. Harvey, Ken 3486
Parallel processing techniques reduce cellular test time. Jewell, Mark; Bird, Steven; Hall, David A. 1681
Platform offers effort-saving flexible system frameworks. 147
Standards module developed for in-system recertification. 133
Synthetic test environment addresses LXI platform. 140
Thermocouple instrument guarantees [+ or -]0.01% accuracy. 139
Vector Signal Generator delivers 20-MHz modulation bandwidth. 144
VXI Oscilloscopes calculate 36+ waveform parameters. 139

Terms of use | Privacy policy | Copyright © 2021 Farlex, Inc. | Feedback | For webmasters |