ED-XRF performs RoHS/ELV screening.
The EDX-GP energy dispersive XRF spectrometer from Shimadzu offers fast, high-sensitivity measurements optimized for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users. The instrument uses the same proprietary semiconductor detector as the EDX-720 to deliver high sensitivity, high resolution and precision measurement of all light to heavy elements. The optical system, special filters and a high-count-rate circuit deliver optimal performance for RoHS/ELV screening. The filters are automatically selected, and high-speed mode conditions are installed by default, allowing batch measurements of RoHS/ELV hazardous elements using a single filter. Users can complete a single-filter, high-speed analysis in 30 sec or high-sensitivity analysis with a special filter in 300 sec. The spectrometer automates instrument startup, calibration, and selecting of analytical conditions. The software also features a measurement time reduction function for high concentrations of hazardous elements and for samples containing no hazardous elements. Shimadzu Scientific Instruments Inc. www.ssi.shimadzu.com, 800-477-1227
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|Title Annotation:||Product News|
|Date:||May 1, 2010|
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