Printer Friendly

Differential probe and positioner.

LeCroy has introduced its D500PT 6 GHz Differential Probe Module and Positioner Mounted Tip for its WaveLink Probe System. Designed with a thin form factor and spring-loaded tips, the module is suitable for use with multiple D500PT probes in tight areas such as the back side of printed circuit boards with ball-grid array packaged integrated circuits. The D500PT probe has 2 mm of Z-axis compliance through spring loaded tips, and it allows considerable angular freedom while still maintaining reliable contact with the device under test. A ball joint between the probe tip and mounting arm is said to make it easy to adjust probe position even when the probe is mounted in a probe positioner. A small thumbscrew allows precise positioning of the tip spacing. Altogether, the D500PT allows the positioning of multiple high performance probes in a very tight space. All the active amplifier circuitry is contained in the probe's tip modules. LeCroy Corp.


For more information enter InfoLINK 124-51001-175 at or call 800-441-6180

COPYRIGHT 2005 Advantage Business Media
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2005 Gale, Cengage Learning. All rights reserved.

Article Details
Printer friendly Cite/link Email Feedback
Title Annotation:Test & Measurement
Publication:ECN-Electronic Component News
Date:Oct 1, 2005
Previous Article:PCI Express[R] analyzer for XMC and PCIe.
Next Article:VME Type 15 Enclosures.

Terms of use | Privacy policy | Copyright © 2021 Farlex, Inc. | Feedback | For webmasters |