Delivery of equipment for nanomachining focused ion beam.
Building contracts for the supply of equipment nanomachining focused ion beam (focussed ion beam - FIB). The device will contain ionic column with a liquid metal ion source - Galia, with high resolution, allowing the nanostructuring of metal and dielectric materials with a high degree of detail. For the purpose of accurate read alignment marks and characterization of nanostructures produced by the device will also allow precise imaging of the sample surface under scanning electron and / or ion microscope (scanning electron and / or ion microscope - SEM / SIM).
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|Date:||Mar 20, 2013|
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