Printer Friendly

Conventional SFM tip deforms surface of polyethylene sample ... while non-contact technique gives sharper image.

A new scanning force microscope technique enables imaging of delicate surfaces without risk of surface damage caused by contact with the tip.

Commercially developed by Park Scientific Instruments, Sunnyvale, CA, the non-contact--or attractive-mode--SFM technique uses the long-range van der Waals forces between the tip and the sample to map the surface's topography. The tip remains 50 A to 100 A from the surface.

The company's Ultralevers silicon cantilevers with integral probe tips used in the attractive-mode technique offer improved image resolution over instruments using low force constant cantilevers and traditional pyramidal tips (left), as shown by the accompanying images of a polyethylene sample.

The new tips (below) are conical in shape with an improved nominal radius of 100 A, compared with conventional pyramidal tips at 400 A.

The higher aspect ratio of the new tips results in truer imaging of steep sidewall and deep trench surface features.

Increased cantilever thickness offers higher force constants, making attractive mode operation possible.

The technique can be used to study surfaces such as soft polymers, biological samples, and organic materials.

COPYRIGHT 1992 Advantage Business Media
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 1992 Gale, Cengage Learning. All rights reserved.

Article Details
Printer friendly Cite/link Email Feedback
Title Annotation:scanning force microscope
Publication:R & D
Date:Apr 1, 1992
Previous Article:Bioreactor slashes coal sulfur content.
Next Article:Shock wave gun promotes advanced materials research.

Terms of use | Privacy policy | Copyright © 2020 Farlex, Inc. | Feedback | For webmasters