This SussCal[R] version 5.1 is calibration software that is necessary for wafer-level measurements as it provides the interface between the VNA and the probe station, simplifying and automating the task of wafer-level calibration. VNAs have good calibration methods for coaxial and waveguide applications, but lack the flexibility and intricacy necessary, for wafer-level measurements. The calibration process removes the effects of systematic errors inherent in all VNAs ensuring accurate and repeatable measurements. SussCal calibration software extends the function of the VNA performing unique advanced LRM+ and SOLR calibrations, as well as the industry standard calibrations SOLT, TRL and LRM.
SUSS MicroTec Test Systems GmbH, Sacka/Dresden, Germany +011 49 35240730.
Circle No. 320