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Buying a scanning electron microscope autoemisnE[degrees]m source of electrons (feg) combined with a scanning ion microscope (fib).

Prior Information Notice: Buying a scanning electron microscope autoemisnE[degrees]m source of electrons (feg) combined with a scanning ion microscope (fib)

The subject of the public contract is a scanning electron microscope with autoemisnE[degrees]m electron source (FEG) combined with scanning ion microscope (FIB). The microscope is equipped with detection of backscattered electrons and secondary electrons and ions to the basic observation of the samples. The microscope is also equipped with detectors for detailed analytical study of the chemical composition and crystallography samples - energy dispersive spectrometer (EDS) detector and diffracted backscattered electrons (EBSD) - in three dimensions (the gradual material removal using FIB). The microscope must also enable the preparation of fins observed specimens for subsequent studies of samples in the transmission electron microscope (TEM).

Estimated value excluding VAT: 20 million CZK

LOTS

Division into lots: no

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Publication:Mena Report
Date:May 29, 2013
Words:155
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