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Analog measurement ICT.

Medalist i3070 Series 5 ICT system now offers analog measurement technology. Is said to be 20 to 30% faster than current model. Permits external circuits to be incorporated for added test coverage, while providing better control of those circuits. Most existing i3070 and 3070 ICT programs will run on the new tester, and fixtures are also compatible. Addresses an array of ICT and functional test needs, including IEEE 1149.6 boundary-scan standard testing and limited-access test applications.


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Title Annotation:off the SHELF
Publication:Circuits Assembly
Date:Nov 1, 2009
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