YieldManager Version 3.0 includes updated analysis, charting, and filtering capability for correlating, comparing, and visualizing process and test data; New features enable engineers to better understand the impact of various parameters on yield and to gauge where in the process flow to focus yield improvement efforts.SUNNYVALE, Calif.--(BUSINESS WIRE)--April 15, 1997--Knights Technology, Inc. announces the release of YieldManager 3.0 -- the latest version of its yield enhancement software system. YieldManager 3.0 includes a wide variety of new charting and filtering capabilities and upgraded data management features for improved visualization and analysis of yield-related data in the fab. New features of YieldManager 3.0 include: -0- -- several new charting options for comparing defect characteristics with various yield data such as bin sort results and kill ratios -- plots for trending and comparing inline and parametric data See parametric symbol. and how they vary by equipment -- parametric "yield" charts showing electrical test failure rates by time, lot, and site -- scrap distribution charts that show where in the process scrap is produced and help engineers determine the major causes of wafer loss -- ability to overlay bin and defect wafermaps -- improved data management options-including archiving -- expanded SPC 1. (business) SPC - Statistical Process Control. Something to do with quality management. 2. (body) SPC - Software Productivity Centre. 3. (company) SPC - Software Publishing Corporation. 4. capabilities YieldManager is a customized, instrument-independent software solution that enables fab engineers to collect, analyze, and graphically display essential process, inspection, and test data to help determine the sources of semiconductor yield loss. The YieldManager system is the only independent software tool designed to interface with data from equipment along the entire process flow-from design, process, inspection, metrology, parametric, and electrical test. Data types supported by YieldManager include defect data, review station data, image data, and WIP WIP Work In Progress WIP Work in Process WIP World Internet Project WIP Women in Prison (movie genre) WIP World Institute of Pain WIP Wash-In-Place WIP Women in Publishing WIP Work In Place WIP Wireless Internet Protocol tracking data (including equipment and operator ID), in-line dimensional data dimensional data see dimensional data. , electrical parametric data, product test data, bitmap data, and wafer scrap information. The data are collected from tools automatically and saved in a central database. YieldManager's client/server architecture An environment in which the application processing is divided between client workstations and servers. It implies the use of desktop computers interacting with servers in a network in contrast to processing everything in a large centralized mainframe. See client/server. allows for interconnectivity and enterprise-wide data sharing The ability to share the same data resource with multiple applications or users. It implies that the data are stored in one or more servers in the network and that there is some software locking mechanism that prevents the same set of data from being changed by two people at the same time. throughout the fab and among manufacturing facilities. Knights Technology offers semiconductor manufacturing software The following list of software modules are the manufacturing components of Baan's ERP (BaanERP) system, acquired by SSA Global in 2003 and subsequently by Infor at the end of 2006. It is listed here because it provides a comprehensive overview of the required software. See MES. solutions for yield enhancement, CAD navigation CAD Navigation refers to software tools which are used for the correlation of electronic semiconductor design data with a physical semiconductor device. CAD Navigation tools consist of software that is capable of reading and displaying the physical layout and logical schematic for , and failure analysis. Leveraging our industry experience with Merlin's Framework(TM) -- the recognized standard in CAD navigation for IC design, failure analysis, defect review, and prototype debugging (programming) debugging - The process of attempting to determine the cause of the symptoms of malfunctions in a program or other system. These symptoms may be detected during testing or use by real users. -- Knights Technology has become an industry leader in yield enhancement solutions for IC manufacturing. Our YieldManager(R) yield enhancement software integrates data from process, inspection, test and metrology equipment and provides sophisticated, graphical analysis tools to convert the data into useful information for yield-related decision making. YieldManager software has been purchased by top fabs around the world. CONTACT: Knights Technology Thomas Sherby, 408/988-0600 (Technical contact) Mary Korn, 408/988-0600 (Financial contact) or Technical Marketing Programs Melissa Beers, 408/737-0285 (PR contact) e-mail: melissa@technicalmarketing.com |
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