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Wafer sort and final memory tester.


Versatest Model V5400?s algorithmic pattern generator (APG APG Assists Per Game (basketball)
APG Assists Per Game (hockey statistic)
APG Aberdeen Proving Ground
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) and tester-per-site (TPS (1) (Transactions Per Second) The number of transactions processed within one second. TPS is a better rating for the performance of hardware and software than the common MHz and GHz rating of the computer. ) architecture provide configuration flexibility and up to four times higher throughput for wafer sort and final memory testing. Tests standard and stacked memory modules such as flash, DRAM and SRAM See static RAM.

SRAM - static random-access memory
 while offering up to 4,608 channels and 144 independent test sites.

Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article.  Inc., agilent.com

Send your product releases to Robin Norvell at rnorvell@upmediagroup.com
COPYRIGHT 2004 UP Media Group, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

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Title Annotation:Product Spotlight
Publication:Circuits Assembly
Date:Oct 1, 2004
Words:69
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