Verigy V93000 HSM High-Speed DRAM Tester Receives Honorable Mention in Test & Measurement World 2007 'Best in Test' Awards.CUPERTINO, Calif. -- Verigy (NASDAQ NASDAQ in full National Association of Securities Dealers Automated Quotations U.S. market for over-the-counter securities. Established in 1971 by the National Association of Securities Dealers (NASD), NASDAQ is an automated quotation system that reports on :VRGY), a premier semiconductor test company, today announced that the Verigy V93000 High-Speed Memory (HSM (1) (Hierarchical Storage Management) The automatic movement of files from hard disk to slower, less-expensive storage media. The typical hierarchy is from magnetic disk to optical disc to tape. ) Series DRAM tester was recognized in the honorable mentions category. The V93000 HSM Series was one of 24 products selected by Test & Measurement World's editors for honorable mention as part of its annual Best in Test awards. "Our introduction last year of the industry's fastest DRAM production tester reflects Verigy's commitment to anticipating the needs of our customers and the market," said Keith Barnes, chief executive officer and president, Verigy. "It is rewarding to see this powerful test solution for the emerging class of high-speed DRAM devices recognized by the Best in Test awards." The V93000 HSM Series is a high-volume production, final-test solution for the new class of high-speed DRAM devices used in memory-hungry computer and consumer electronics devices, such as game consoles (Sony PlayStation Sony Playstation - Playstation 3 and Microsoft Xbox 360, for example), high-definition TV See HDTV. , and servers. The V93000 HSM Series addresses the unique requirements of high-speed memory test with its tester-per-pin architecture that enables higher speeds, precision accuracy and improved yields, making it the lowest cost-of-test solution for this emerging class of high-speed memory. With full I/O (Input/Output) The transfer of data between the CPU and a peripheral device. Every transfer is an output from one device and an input to another. See PC input/output. I/O - Input/Output and maximum memory core access testing at up to 3.6 Gbps in a single insertion into the test system, the V93000 HSM Series offers the best performance available for high-speed memory test including GDDR GDDR Geographically Dispersed Disaster Restart GDDR Graphics Double Data Rate and XDR (1) (EXternal Data Representation) A data format developed by Sun that is part of its networking standards. It deals with integer size, byte ordering, data representation, etc. and is used as an interchange format. . About the Best in Test Awards The Best in Test Awards are presented annually by the editors of Test & Measurement World. These awards honor important and innovative new products and services in the electronics test and measurement industry. Eligible products introduced between November 1, 2005, and October 31, 2006 were nominated by vendors and carefully reviewed by the magazine's editors. Products from all areas of electronics testing and inspection are eligible. Test & Measurement World has been presenting the Best in Test Awards since 1991. About Verigy Verigy designs, develops, manufactures, sells and services advanced test systems and solutions for the flash memory and system-on-chip segments of the semiconductor industry. Verigy's scalable platform systems are used by leading semiconductor companies worldwide in design validation, characterization, and high volume manufacturing test. Formerly part of Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article. , the company began doing business as Verigy on June 1, and completed its initial public offering on June 13, 2006. Information about Verigy can be found at www.verigy.com. |
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