VLSI test symposium; proceedings.

9780769535982

VLSI test symposium; proceedings.

IEEE VLSI Test Symposium (27th: 2009: Santa Cruz, CA)

Computer Society Press

2008

341 pages

$248.00

Paperback

TK7874

The proceedings of the 27th IEEE VLSI Test Symposium are contained in this volume, with sessions dedicated to innovations in the field of integrated circuit and system testing. Aimed at engineers and participants, this volume features research papers on such topics as microprocessor tests, fault models, robust design and fault tolerance, delay fault testing, debugging, multiple-fault diagnosis, yield estimation and mixed-mode BIST. Special sessions on analog characterization testing and functional verification planning and management are also included.

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