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USING FERROELECTRIC MATERIALS FOR MICROWAVE ELECTRONICS.


Thin-film ferroelectric Refers to a material that functions similarly to a ferromagnetic material in that it can be polarized into two states. Ferroelectric devices generally do not have any "ferrous" (iron) in them. See FeRAM and ferroelectric capacitor.  materials have received considerable attention because of their growing use in electronic, electro-optic, optical and acoustic devices. Potential applications include random access memories, pyroelectric py·ro·e·lec·tric  
adj.
Relating to or exhibiting pyroelectricity.

n.
A pyroelectric material.

Adj. 1. pyroelectric - relating to or exhibiting pyroelectricity
pyroelectrical
 detectors, acoustic transducers and microwave devices.

An important characteristic of these materials is the ability to change their dielectric constants by an externally applied electric field. This idea is being pursued in a class of novel high-temperature-superconducting tunable microwave devices such as microstrip line phase shifters, high-Q resonators and tunable filters. Of the various ferroelectric materials, perovskite Perovskite (calcium titanium oxide, CaTiO3) is a relatively rare mineral on the Earth's crust. Perovskite crystallizes in the orthorhombic (pseudocubic) crystal system.  oxide thin films are considered potential candidates for tunable microwave devices because of their high dielectric constant.

As part of its program on new non-linear dielectric films, scientists from NIST (National Institute of Standards & Technology, Washington, DC, www.nist.gov) The standards-defining agency of the U.S. government, formerly the National Bureau of Standards. It is one of three agencies that fall under the Technology Administration (www.technology.  and the University of Colorado University of Colorado may refer to:
  • University of Colorado at Boulder (flagship campus)
  • University of Colorado at Colorado Springs
  • University of Colorado at Denver and Health Sciences Center
  • University of Colorado system
 at Boulder have investigated perovskite oxide thin films for cryogenic and ambient temperature applications. In a recent technical paper, they discuss film growth as well as the structural and low- frequency dielectric properties of the films. They also present dielectric data obtained on some bulk samples and, in order to understand the effect of strain on dielectric properties, present results on high-resolution x-ray diffraction studies on some of the films.
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Publication:Journal of Research of the National Institute of Standards and Technology
Article Type:Brief Article
Date:Sep 1, 2000
Words:188
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