Printer Friendly
The Free Library
22,728,043 articles and books

The boundary scan infrastructure: a primer on how boundary scan, or JTAG, works.



Boundary scan See scan technology.

boundary scan - The use of scan registers to capture state from device input and output pins. IEEE Standard 1149.1-1990 describes the international standard implementation (sometimes called JTAG after the Joint Test Action Group which began the
 or, more accurately, the IEEE (Institute of Electrical and Electronics Engineers, New York, www.ieee.org) A membership organization that includes engineers, scientists and students in electronics and allied fields.  1149.1 Standard Boundary Scan Test Strategy, traces its roots to the mid 1980s. That's when an ad hoc For this purpose. Meaning "to this" in Latin, it refers to dealing with special situations as they occur rather than functions that are repeated on a regular basis. See ad hoc query and ad hoc mode.  working group, the Joint Test Action Group (hence the JTAG (Joint Test Action Group) An IEEE standard for boundary scan technology. See scan technology.

JTAG - Joint Test Action Group
 name for the methodology), began working on concepts for a circuit board test technology that would not require physical contact between a probe and a circuit board.

Several trends pointed to the disappearance of physical access for test probes. Device packages that were new at the time (like ball grid arrays) placed device pins under the silicon. As a result, probes could not be applied to the pins. Moreover, additional functionality was being packed onto circuit boards at a time when the size of the boards themselves was shrinking. Something had to give; most often, test points or test pads were eliminated from boards to save real estate. At the same time, multilayer boards increased the difficulties of physically accessing chip-to-chip interconnect nets below the surface layer of the board.

[FIGURE 1 OMITTED]

Out of this context the JTAG group began forming a boundary scan test strategy. The eventual solution centered on the concept of embedding an internal shift register around the perimeter of semiconductor devices, a boundary scan register.

At the chip level, a component is defined as a boundary scan device when each primary input and output signal is supplemented with a multipurpose mul·ti·pur·pose  
adj.
Designed or used for several purposes: a multipurpose room; multipurpose software.


multipurpose
Adjective
 memory element called a boundary scan cell (Figure 1). A board's collection of boundary scan cells is configured into a parallel-in, parallel-out shift register by way of a four-wire interface. This scan path scan path - (circuit design) A technique used to increase the controllability and observability of a logic circuit by incorporating "scan registers" into the circuit. Normally these act like flip-flops but they can be switched into a "test" mode where they all become one long shift , as it is called, is made up of test data in (TDI TDI - Transport Driver Interface ), test clock (TCK TCK Technology Compatibility Kit
TCK Türk Ceza Kanunu (Turkish Penal Code)
TCK Test Clock
TCK Test Compatibility Kit
TCK Third Culture Kid
TCK Tactical Communications Kit (Cisco)
TCK Trinity College Kandy
), test mode select (TMS TMS Transcranial Magnetic Stimulation (alternative medicine for depression)
TMS Test Match Special (sports - cricket)
TMS Texas Motor Speedway
TMS Transportation Management System
TMS Toyota Motor Sales
) and test data out (TDO TDO Type Descriptor Object (Oracle Call Interface, 8.1)
TDO Test Data Out
TDO Temporary Detention Order
TDO Technologie voor Duurzame Ontwikkeling
TDO Tallahassee Democrat Online
TDO Typed Data Object
) signals. A fifth signal, test reset (TRST TRST Trust
TRST Teacher Retirement System of Texas
TRST Test Logic Reset
TRST Test Reset Input Signal
) is optional. Collectively these device pins are known as the test access port (TAP). Data can be shifted into and out of the scan chain Scan chains are a technique used in Design For Test. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. A special signal called scan enable is added to a design.  connecting the boundary scan cells on multiple devices on a board. Because of these capabilities, boundary scan cells can be thought of as virtual nails because they are able to set up and apply tests across the interconnect structures on the board.

Devices that do not have embedded boundary scan cells can still be tested by boundary scan. A JTAG device directly connected to a non-boundary scan device can drive signals onto the non-boundary scan device and test its interconnects in this way.

Test Development

Before a boundary scan test pattern can be automatically generated by a test system (see Figure 2 for the configuration of a typical boundary scan test or programming station), boundary scan devices on the board and the scan path must be characterized. The test development station does this by examining the board netlist and compiling a database with files that describe the boundary scan devices in boundary scan description language Boundary scan description language (BSDL) is a description language for electronics testing using JTAG. It has been added 1996 to the IEEE Std. 1149.

Boundary Scan Description Language (BSDL) is a subset of VHDL that is used to describe how JTAG (IEEE 1149.
 (BSDL (Boundary Scan Description Language) An IEEE language used to describe structures for boundary scan testing. See scan technology. ). BSDL is defined in the IEEE 1149.1 standard. A device's BSDL file describes all the boundary scan features of the device.

Non-boundry scan devices to be tested must also be characterized in the design's database. Online libraries of models that describe non-boundary scan devices can be automatically downloaded by the test generation system and included in the database to extend the reach of JTAG tests to non-boundary scan devices.

As part of the test generation process, advanced boundary scan test systems will generate fault coverage reports that indicate how much test coverage can be derived from the information provided in a database. The user can then decide whether more information should be provided or certain steps to take to increase test coverage.

[FIGURE 2 OMITTED]

Following the application of test patterns, a test results report is generated. Diagnostic tools included in the more advanced JTAG systems can isolate faults or defects down to the level of a particular pin on a device.

Access provided by boundary scan can also be used to load data or software into programmable logic devices (PLDs) or memory after these devices have been soldered onto a board. This in-system programming or in-system configuration capability eliminates the need to remove devices from boards to load new versions of firmware or software. Even after a system has been installed, firmware updates can be loaded into PLDs via boundary scan.

Test Reuse

A major benefit of boundary scan technology is the portability of testing and programming operations. For example, tests developed during a system's design phase to debug To correct a problem in hardware or software. Debugging software means locating the errors in the source code (the program logic). Debugging hardware means finding errors in the circuit design (logical circuits) or in the physical interconnections of the circuits.  prototypes can migrate with the system as it moves into manufacturing, where the same tests can be applied by a benchtop JTAG manufacturing station or combined with other tests on an in-circuit test (ICT (1) (Information and Communications Technology) An umbrella term for the information technology field. See IT.

(2) (International Computers and Tabulators) See ICL.

1. (testing) ICT - In Circuit Test.
) platform. Seamless integration of a full-blown boundary scan system on an ICT system offers significant cost savings by eliminating the need to redevelop boundary scan tests from the development department and the coverage supplied by JTAG tests will simplify ICT tests, cutting the cost of fixtures and the time to produce them.

Boundary scan tests can also migrate with a system into the field where they can be used to troubleshoot malfunctions or to load new versions of embedded firmware.

The engineers who developed the IEEE 1149.1 standard more than a decade ago might be surprised by today's applications of this technology. Boundary scan has branched out beyond its roots as a test methodology for shorts and opens.

Several new IEEE standards and at least one proprietary embedded test methodology depend upon the JTAG infrastructure. The IEEE 1149.6 Boundary Scan Standard for Advanced Digital Networks, for example, uses scan chains to test high-speed serial buses such as Gigabit Ethernet and Fibre Channel. In addition, the IEEE 1532 Standard for In-System Configuration is based on boundary scan access to PLDs. Multiple PLDs can be configured concurrently with IEEE 1532, reducing programming times considerably. Also, Intel recently delivered a JTAG-based embedded test technology known as interconnect built in self test (IBIST). IBIST will be included in many of Intel's future chips to lower the overall cost of test and more effectively validate high-speed buses.

David Bonnett is technical manager, ASSET InterTech Inc. (asset-intertech.com); dbonnett@asset-intertech.com.
COPYRIGHT 2005 UP Media Group, Inc.
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2005, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Title Annotation:Virtual Nails
Author:Bonnett, David
Publication:Circuits Assembly
Date:Jun 1, 2005
Words:1018
Previous Article:Underfills in Pb-free assemblies: increased stresses on assemblies--the result of lead-free soldering--raise the possibility of underfills as...
Next Article:Pb-free solder processing and reliability: no drop-in lead-free alloy exists, but several are "almost" there. A summary of metallurgical and process...



Related Articles
Microscope writes beneath a metal surface.
HITACHI ANNOUNCES NEW 50-INCH PLASMA DISPLAY.
In-circuit test system.
ASSET ScanWorks JTAG System Integrated into New Agilent Medalist i5000 In-Circuit Test Platform.
The basics of boundary scan: this technique permits reuse of test data and cuts costs by eliminating ICT and functional test.
Design for concept time: next-generation testers perform most of the heavy lifting at the wafer level.
Low-cost ICT.

Terms of use | Copyright © 2014 Farlex, Inc. | Feedback | For webmasters