Teradyne and Electroglas Join Forces to Develop Integrated Test System; Test industry leaders create fully integrated, state-of-the-art system.

SANTA CLARA, Calif.--(BUSINESS WIRE)--Aug. 22, 1995-- Electroglas, Inc. (Nasdaq:EGLS), a market-leading supplier of automatic wafer probing systems to the global semiconductor industry, today announced that it has joined forces with ATE giant Teradyne, Inc. to create a comprehensive, fully integrated turnkey test system for the IC memory market.

Geared toward high-volume production, the joint Electroglas-Teradyne solution will enable IC manufacturers to efficiently test memory devices on 32 sites in parallel at 85 degrees C. The system has already been designated for use at various manufacturing fabs around the world.

The joint hardware and software development is a direct response to aggressive manufacturing plans that require a production-proven, integrated test system that could be installed quickly and operate ergonomically. Developed in less than five months, the solution was integrated at Teradyne's Agoura Hills facility and combines Teradyne's J993 memory test system with the Electroglas Horizon 4080X(R) prober equipped with a Hinged Testhead Manipulator and Bottom Probe Card Changer.

According to Harold LaBonte, product marketing manager for memory test systems at Teradyne, the resulting integrated turnkey system demonstrates the success of teamwork efforts at all levels of the two organizations. "The total system solution optimizes the performances of the test at probe. We are providing our customers with a complete solution that will reduce their time to market and get them into production without delay. The fully integrated system is now in use with both the J993 and the J995," stated LaBonte.

Noted Andrei Berar, Electroglas' product marketing manager for interface and peripheral products, "We are pleased to have the opportunity to work with Teradyne on developing this solution, which is designed to maximize system uptime, test floor resources and overall efficiency -- delivering highly increased yields."

Teradyne's J993 memory test system is optimized for production wafer test applications, and can test up to 32 devices in parallel on two test stations. The system runs at speeds from 60 to 120MHz, with an overall timing accuracy to 500ps. With the J993, Teradyne made its revolutionary Tester-Per-Site(TM) architecture available to semiconductor manufacturers for high-volume wafer production.

The J995 memory test system is optimized for high-volume production testing of DRAMs up to 36 bits wide. The system employs the same Tester-Per-Site architecture used in other J990 Series systems. Teradyne officials report that Tester-Per-Site provides throughput advantages from 25 to 60 percent compared to the traditional shared-resource architecture of other memory test systems.

The Electroglas Horizon 4080X automatic wafer prober for 8-inch wafers merges powerful automation with advanced system software for enhanced productivity. Compatible with all major ATE manufacturers and multiple factory networks, the 4080X offers high-speed probing for single-cassette applications and is accurate within 0.2 mil (5.0um). The Hinged Testhead Manipulator provides cost-effective, accurate and repeatable docking of the testhead to the wafer prober, and features controllable 180 degree rotation. The Bottom Probe Card Changer facilitates rapid and safe changing of probe cards without undocking the testhead.

About Teradyne, Inc.: The J990 Series memory test systems are produced by Teradyne's Semiconductor Test Division in Agoura Hills, Calif. The Division also produces the J971 and the J921 Series VLSI test systems. Teradyne is a leading manufacturer of automatic test equipment and connection systems. Its stock is traded on the New York Stock Exchange under the symbol TER. Total Teradyne sales for 1994 were approximately $667 million.

About Electroglas: Founded in 1960, Electroglas, Inc. is a world-leading supplier of the automated wafer-probing products that semiconductor manufacturers rely on to sort and classify integrated circuits. The company's products position semiconductor devices that are still in wafer form under contact probes to facilitate accurate, rapid, reliable testing, and manage information collected during the testing process. Electroglas' common stock is traded on the Nasdaq Stock Market under the trading symbol EGLS. -0-

NOTE TO EDITORS: Tester-Per-Site is a trademark of Teradyne, Inc.

CONTACT: Electroglas, Inc.

Yolanda Ruiz, 408-727-6500, x6287, Fax: [phone]

or

MCA, Inc.

Lisa Gillette, 415-968-8900, Fax: [phone]