Teradyne Demonstrates Test Solutions for Emerging Technologies at SEMICON China.

Business Editors/High-Tech Writers

SEMICON China 2003

SHANGHAI, China--(BUSINESS WIRE)--March 7, 2003

Teradyne, Inc. (NYSE:TER) will participate in the semiconductor industry tradeshow SEMICON China (Booth 2455) in Shanghai March 12-14, demonstrating test solutions for Wireless, BBAC, PC Audio and a DVD device "made in China" on two industry leading test systems. Wireless and Broadband device tests will be demonstrated on Teradyne's Catalyst test system and Teradyne's Integra J750 will be demonstrating test solutions for PC Audio and DVD decoder devices.

"We're excited to be returning once again to SEMICON China," said Hock Chiang, Managing Director, Teradyne Semiconductor Test Operations in China. "SEMICON China provides us with the opportunity to demonstrate test solutions for device technologies that are emerging in China. With an expanding presence in China, Teradyne now begins manufacturing the Integra J750 test system locally to further meet the needs of the region's growing electronics industry. We look forward to providing the test technology that enhances our customer's success."

Wireless Device Test on Catalyst

Teradyne's MicroWAVE6000(TM) instrumentation suite provides a complete range of RF/microwave test capabilities required for current and future wireless devices and communications standards. At SEMICON China, Teradyne will demonstrate the MicroWAVE6000 suite of instrumentation on the Catalyst test system with devices from three different wireless markets.

-- A Mobile Phone Transceiver with 1.9GHz operation will demonstrate the Waveform Analyzer, dual site testing, easy-to use template test development and debug tools, and the precision IQ balance and GSM modulation.

-- A Bluetooth(TM) Transceiver with 2.4GHz operation will demonstrate GFSK modulation, quad site testing and frequency hopping.

-- An 802.11a Wireless Local Area Network (WLAN) transceiver will demonstrate 5GHz operation and OFDM Modulated testing

BBAC on Catalyst

The latest AC instrumentation developed by Teradyne, BBAC(TM) (Broadband AC), provides source and capture to 15MHz of bandwidth with the highest performance, capability, and throughput advantages for testing today's most demanding mixed signal SOC devices. BBAC's next generation analog design utilizes state of the art technology that accelerates BBAC measurement capability far beyond conventional analog instrument designs by lowering noise and distortion across the entire bandwidth of the instrument. At SEMICON China, Teradyne will demonstrate BBAC's analog performance advantages as well as its capabilities to test a multisite 16 bit ADSL AFE (Analog Front End) device.

PC Audio Test on Integra J750

Teradyne's demonstration of the Mixed Signal Option for the J750 features the Digital Signal I/O board and an Analog Signal board Set testing a quad site, digital, high-performance 16-bit audio CODEC device used in sound cards. The engineering test program developed for eMicro shows the J750 mixed signal testing capabilities with DAC and ADC tests for Digital Audio, new programming methodology for mixed-signal test, tools for mixed signal debugging, and per site instrumentation. Now manufactured in China, the Integra J750 is the ideal test solution for cost sensitive SOC devices.

"Made in China" DVD Device Test

Demonstrating the J750's Converter Test Option (CTO) and scan capability, Teradyne highlights a DVD decoder IC - a complex SOC device with a sophisticated digital to analog converter (DAC). This device, designed and made in China, is an advanced, second generation, single-chip Progressive-Scan output DVD multimedia processor from Amlogic, a leading supplier of highly integrated system-on-a-chip solutions in the fast growing multimedia and internet consumer markets.

About Catalyst

Catalyst dominates the SOC market with over 1000 systems shipped. Test capabilities include full coverage for DSL, broadband, wireless/RF, networking, and power management applications. With more than 4,000 individual users worldwide, Catalyst's IMAGE(TM) programming system is the most widely used ATE software environment. Catalyst offers multi-site testing, providing the best test economics, and the most complete array of analog instrumentation for test coverage and production flexibility. When a mobile phone call is placed, or a PC, printer, scanner, pager, or DVD is utilized, Catalyst tested ICs make it happen and with the lowest cost of test.

About Integra J750

The J750's high-throughput parallel test capability provides as high as 95% parallel test efficiency for up to 32 devices. The zero footprint system delivers up to 1,024 I/O channels contained in a test head, and offers a suite of options, including the Converter Test Option, Memory Test Option, Redundancy Analysis, and Mixed Signal Option, that broaden the range of testing capabilities. The system also features IG-XL test software that combines the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, such as Microsoft Excel and Visual Basic. The J750's small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

About Teradyne

Teradyne (NYSE:TER) is the world's largest supplier of Automatic Test Equipment, and a leading supplier of interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2002, Teradyne had sales of $1.22 billion, and employed about 7000 people worldwide. For more information, visit www.teradyne.com.

MicroWAVE6000, IMAGE, BBAC are trademarks of Teradyne

Bluetooth is a trademark owned by the Bluetooth SIG, Inc.