Printer Friendly
The Free Library
14,508,125 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

Tanner Labs Now Offers Scanning Electron Micrograph (SEM) Services in Its MEMS R&D and Fabrication Facility.


Tool Helps Increase Manufacturing Yield of Micro-Electro-Mechanical Systems Micro-electro-mechanical systems (MEMS)

Systems that couple micromechanisms with microelectronics. Such systems are also referred to as microsystems, and the coupling of micromechanisms with microelectronics is also termed micromechatronics.
 (MEMS (MicroElectroMechanical Systems) Tiny mechanical devices that are built onto semiconductor chips and are measured in micrometers. In the research labs since the 1980s, MEMS devices began to materialize as commercial products in the mid-1990s. ) by as Much as 50 Percent

PASADENA, Calif. -- Tanner The code name for the Xeon version of the Pentium III chip. See Xeon.  Labs, a division of Tanner Research, today said it will begin offering scanning electron micrograph electron micrograph
n.
A micrograph made by an electron microscope.
 (SEM) services in its MEMS R&D and Fabrication fabrication (fab´rikā´shn),
n the construction or making of a restoration.
 Facility in Pasadena. Tanner has used the SEM system internally but is now offering it externally.

MEMS, or micro-electro-mechanical devices, integrate traditional microelectronics, or silicon-based devices, with mechanical elements, sensors and actuators to create chips that have not just computational capabilities but can sense and control. MEMS devices are used in a variety of applications including biotechnology, communications, accelerometers for crash testing and many others that require analysis and control.

The SEM services from Tanner Labs rapidly image and critical process steps on wafer lots, which helps improve the numbers of usable devices made by as much as 50 percent. Imaging of thin films and structures during processing enables subsequent process steps to be optimized for maximizing device yield.

The SEM device, a Cambridge Stereoscan 240, can load sample sizes as large as four inches with resolution of 10 nanometers. This resolution limit is useful for examining nano-structures with sub-micron features.

Other key features of the SEM system include:

* Acceleration voltage of 0.3kV to 30kV enabling examination of uncoated or delicate specimens, which are sensitive to electron bombardment

* Magnification Magnification

A measure of the effectiveness of an optical system in enlarging or reducing an image. For an optical system that forms a real image, such a measure is the lateral magnification m
 between 5 and 300,000 times of actual features

* Chamber capacity of 200 mm diameter devices, enabling monitoring large device arrays without destructive dicing dicing Trauma surgery Multiple 0.5-1.0 cm, cube-like lacerations of the skin seen in MVA victims who strike shattered tempered glass car windows  or cleaving

Tanner Research, Inc.

Founded in 1988, Tanner Research, Inc. is a privately held company privately held company

A firm whose shares are held within a relatively small circle of owners and are not traded publicly.
 headquartered in Monrovia, CA. Tanner Research, through its MEMS R&D and Fabrication Facility supports advanced research and development. The facility provides more than 1,000 square feet of dedicated Class 1000 and Class 100 cleanroom space and enables the development and low-volume manufacturing of MEMS using traditional silicon-based processes, as well as innovative and non-traditional, low-temperature (<250ae C) materials and processes. Manufacturing examples include gyroscopes, ink jet See inkjet printer.  devices, micro thrusters, and other microfluidic devices. Tanner Research MEMS R&D and Fabrication Facility services include:

* Research and development partnerships: direct access to the Tanner MEMS staff and cleanroom facility for qualified customers with in-house MEMS design and processing expertise.

* Full-service MEMS research and development: highly effective MEMS and microelectronics technology, product, and fabrication process research and development.

* Prototype and pilot line MEMS fabrication (low-volume "foundry" services): prototype and low volume initial production for mature MEMS designs.

For more information about Tanner Research, Inc., please visit www.tanner.com or call 626-471-9700.

All brands and trademarks are the property of their respective owners.
COPYRIGHT 2007 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2007, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Date:Jan 8, 2007
Words:434
Previous Article:Ralink Technology's Wireless LAN Product Receives Wi-Fi Protected Setup(TM) Certification and Selection in Test Bed by Wi-Fi Alliance(R).
Next Article:Research and Markets: Key Company Data Now Available on AFS Systems.
Topics:



Related Articles
Santorini volcanic ash found in Egypt.
SUCCESSFUL ISEMATECH/NIST EXPERIMENT WITH "SHARP-TIP" EMITTERS USED IN CD-SEM.(National Institute of Standards and Technology)(Brief Article)
NEW "MODEL FUNCTION" FOR SEM IMAGES OF DENSE LINES.(scanning electron microscope)(Brief Article)
MEMS: A View from Aerospace -- The potential of MEMS in mil/aero applications appears almost limitless, but, first, the dreaded ilities must be...
New reference material simplifies SEM performance checks. (News Briefs).(scanning electron microscopes)(Brief Article)
Sela announces installation of MC600 microcleaving system at Hitachi's U.S. demo facility.
Newest critical dimension scanning electron microscopes use NIST technology. (News Briefs).(National Institute of Standards and Technology)(Brief...
SEM offers destruction services.(Market place: new products & industry announcements)(Security Engineered Machinery )(Brief Article)
National Institute of Advanced Industrial Science and Technology (AIST) Achieves Real-Time Observation of Nano-Scale Cutting Process.
Defects in molded silicone medical part identified.(Case Studies)

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles