Printer Friendly
The Free Library
14,735,205 articles and books
Member login
User name  
Password 
 
Join us Forgot password?

TRADE NEWS: Agilent Technologies' New High-Speed I/O Solution Provides Industry's Lowest-Cost Testing of High-Speed SOC Devices.


PALO ALTO Palo Alto, city, California
Palo Alto (păl`ō ăl`tō), city (1990 pop. 55,900), Santa Clara co., W Calif.; inc. 1894. Although primarily residential, Palo Alto has aerospace, electronics, and advanced research industries.
, Calif. -- Complete PC Chipset A set of chips that provides the interfaces between all of the PC's subsystems. It provides the buses and electronics to allow the CPU, memory and input/output devices to interact.  Solution for under $1.8 Million Enables Functional Testing (testing) functional testing - (Or "black-box testing", "closed-box testing") The application of test data derived from the specified functional requirements without regard to the final program structure.  up to 3.6 Gb/s

Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article.  Inc. (NYSE NYSE

See: New York Stock Exchange
:A) today introduced an automated test solution for functional, at-speed test that reduces the cost of testing high-speed, system-on-a-chip (SOC) devices to the lowest in the industry. Part of the Agilent 93000 SOC Series, this complete high-speed I/O (Input/Output) The transfer of data between the CPU and a peripheral device. Every transfer is an output from one device and an input to another. See PC input/output.

I/O - Input/Output
 solution enables functional testing of high-pin-count devices, such as next-generation PC chipsets up to speeds of 3.6 Gb/s.

The solution is enabled by Agilent's new Pin Scale 3600 Digital Card, which offers unprecedented per-pin scalability from 800 Mb/s to 3.6 Gb/s, allowing the test system to be configured to match device requirements, pin by pin and at the lowest cost. High-speed SOC devices are widely used in computer, digital consumer, communications, and networking products.

The demand for more functionality in a single electronic device is driving the convergence of consumer devices and redefining the digital home. As a result of this miniaturization min·i·a·tur·ize  
tr.v. min·i·a·tur·ized, min·i·a·tur·iz·ing, min·i·a·tur·iz·es
To plan or make on a greatly reduced scale.



min
 and increased functionality of consumer electronics, SOCs are becoming very complex. The uncertainty in the rate of integration and the convergence of consumer devices requires that test equipment have the scalability and capability to test next-generation SOCs with higher speeds and more interfaces. At the same time, the continuing price pressure on consumer electronics makes it imperative to keep cost-of-test as low as possible.

Consumer demand for more data-intensive applications, such as 3D gaming and video editing See nonlinear video editing and video editor. , is driving the need for faster processing and higher-speed interfaces in next-generation SOC devices. Next-generation SOCs are designed using deep submicron process technologies, such as 90 nm and below, that generate a new class of defects and require faster, more accurate high-speed testing. Nanometer fabrication fabrication (fab´rikā´shn),
n the construction or making of a restoration.
 defects such as timing failures, for example, manifest themselves only at higher frequencies and must be tested at-speed. Similarly, signal integrity issues such as inductive inductive

1. eliciting a reaction within an organism.

2.


inductive heating
a form of radiofrequency hyperthermia that selectively heats muscle, blood and proteinaceous tissue, sparing fat and air-containing tissues.
 crosstalk (1) Electromagnetic interference that comes from an adjacent wire. "Alien" crosstalk is interference that comes from a wire in an adjacent cable, for example, when two or more twisted wire pair cables are bundled together.  and electromigration cannot be revealed by current simulation techniques and need to be identified by using at-speed functional tests.

"The convergence of electronics and the complexity of next-generation SOCs have made it imperative for customers to balance risk and cost," said Tom Newsom, vice president of Agilent and general manager of its SOC Business Unit. "The Agilent 93000 SOC Series' scalable platform architecture empowers our customers to meet these next-frontier risks at the industry's lowest cost. As data rates go higher and more interfaces are integrated into complex SOCs, the Agilent 93000 can scale to higher speeds or additional pins, providing customers with a low-risk solution for the future."

Based on the scalable platform architecture of the Agilent 93000 SOC Series, the Pin Scale 3600 Digital Card allows each test pin to be configured from 800 Mb/s to 3.6 Gb/s using software upgrades that can be performed instantly to meet changing test needs. Each pin offers both single-ended and differential I/O test capabilities that make it possible to test a wide range of interfaces including DDR (Double Data Rate) Refers to an SDRAM memory chip that increases performance by doubling the effective data rate of the frontside bus. For more details, see SDRAM.

DDR - Double Data Rate Random Access Memory
, G-DDR, PCI Express A high-speed peripheral interconnect from Intel introduced in 2002. Note that although sometimes abbreviated "PCX," PCI Express is not the same as "PCI-X" (see PCI-SIG and PCI-X for comparison). As a result of the confusion, "PCI-E" or "PCIe" is the accepted abbreviation. , S-ATA, HyperTransport and Front Side Bus (FSB (FrontSide Bus) See system bus.

FSB - front side bus
). The configurability allows the automated test equipment to be matched to the device through software scaling, pin by pin, which results in lower costs.

The Agilent Pin Scale 3600 Digital Card features a test processor per-pin architecture, which localizes all test processing instead of using centralized resources, resulting in minimal measurement overhead and higher throughput. This architecture also delivers a differential pin edge placement accuracy (EPA EPA eicosapentaenoic acid.

EPA
abbr.
eicosapentaenoic acid


EPA,
n.pr See acid, eicosapentaenoic.

EPA,
n.
) of better than +/-30 ps, which is required for high-speed device testing.

With an industry record of up to eight independent clock domains, the Agilent 93000 SOC Series can satisfy the most complex timing needs for concurrent at-speed testing of multiple buses running at non-friendly speed ratios (bus fractions). As the speed of next-generation interfaces rises above 3.6 Gb/s, the Agilent 93000 SOC Series' high-speed I/O solution will allow customers to upgrade to more than 8 Gb/s functional test capabilities, thereby protecting their investment in test equipment.

Pricing and Availability

Agilent's high-speed I/O solution is comprised of the 93000 SOC Series, Pin Scale 3600 Digital Cards and associated software, services and support. The solution is available in various data-rate, memory and pin-count configurations. A complete PC chipset solution configured with more than 600 Pin Scale 3600 pins is available for less than $1.8 million. This configuration includes more than 250 pins operating at 1.8 or 3.2 Gb/s for interfaces such as PCI Express, FSB, S-ATA and others. (Additional high-speed pins can be added to the solution for just $2,000 per pin, as device test requirements change.)

Agilent's high-speed I/O solution will be available in January 2005. More information about the Pin-Scale 3600 Digital Card is available at www.agilent.com/see/pinscale3600.

About the Agilent 93000 SOC Series

The Agilent 93000 SOC Series is the industry's fastest-growing, lowest-cost single, scalable platform architecture with more than 850 installed systems worldwide. The Agilent 93000 SOC Series is designed to meet both the demanding performance and cost challenges of SOC testing. Models are configured to span the widest range of applications that may require ultra-high-speed digital data rates, up to 10 Gb/s, and the broadest range of mixed-signal and RF capabilities. With this range of capabilities, the 93000 SOC Series is the first choice for subcontract manufacturers and the preference for high-volume manufacturing. More information is available at www.agilent.com/see/soctest.

More information about Agilent's semiconductor test products is available at www.agilent.com/see/atenews.

About Agilent Technologies

Agilent Technologies Inc. (NYSE:A) is a global technology leader in communications, electronics, life sciences and chemical analysis. The company's 28,000 employees serve customers in more than 110 countries. Agilent had net revenue of $6.1 billion in fiscal year 2003. Information about Agilent is available on the Web at www.agilent.com.

NOTE TO EDITORS: Further technology, corporate citizenship Corporate Citizenship

The extent to which businesses are socially responsible in meeting legal, ethical and economic responsibilities placed on them by shareholders. The aim it to create higher standards of living and quality of life in the community in which it operates, while
 and executive news is available on the Agilent news site at www.agilent.com/go/news.
COPYRIGHT 2004 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2004, Gale Group. All rights reserved. Gale Group is a Thomson Corporation Company.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Geographic Code:1USA
Date:Nov 1, 2004
Words:1002
Previous Article:Tonic Software Announces Partnership with New York Life to Help Company Manage E-Business Applications; WebCommand Active Monitoring Helps Insurer...
Next Article:TRADE NEWS: Agilent Technologies Offers Industry-First FPGA Dynamic Probe Application for Mixed-Signal Oscilloscopes.
Topics:



Related Articles
CICADA SEMICONDUCTOR SELECTS AGILENT TECHNOLOGIES 93000 SOC SERIES TO ACCELERATE ADOPTION OF GIGABIT ETHERNET NETWORKING.
NVIDIA Selects Agilent Technologies 93000 SOC Series for Testing PCI Express-Based Graphics Processors.
TRADE NEWS: Agere Systems Selects Agilent Technologies' 93000 SOC Series Test System for Serial Attached SCSI Controller IC Development, Production...
STATS ChipPAC Forges $125 Million Agreement with Agilent Technologies, Adopts Agilent 93000 SOC Series Test System.
Agilent Technologies Adds Exar to Growing List of 93000 SOC Series Customers.
TRADE NEWS: Agilent Technologies Introduces Industry's Lowest-Cost Wafer Sort and Probe Test Solution.
Agilent Technologies and Synopsys Announce Industry-First Scan Diagnostics Reference Methodology.
Agilent Technologies' New Industry-First Per-Pin, Floating Licenses Help Semiconductor Manufacturers Increase Profitability.
TRADE NEWS: Agilent Technologies' New Software-Configurable Pin Scale 800 Digital Card Maximizes Asset Utilization, Lowers Cost of Test.
TRADE NEWS: IDT Upgrades Its Agilent Technologies 93000 Series SOC Tester with 8 Agilent BIST Assist Cards; Cards Used in High-Speed,...

Terms of use | Copyright © 2009 Farlex, Inc. | Feedback | For webmasters | Submit articles