TRADE NEWS: Agilent Technologies, ACCRETECH, Cascade Microtech and Micronics Japan Provide New Semiconductor Process Test Solutions.Business Editors/High-Tech Writers SEMICON SEMICON Semiconductors Equipment and Material International Conference Japan 2002 CHIBA, Japan--(BUSINESS WIRE)--Dec. 3, 2002 New Parametric Test Solutions Increase Throughput, Lower Production Costs, Reduce Time to Market and Improve Yield for CMOS (Complementary Metal Oxide Semiconductor) Pronounced "c-moss." The most widely used integrated circuit design. It is found in almost every electronic product from handheld devices to mainframes. Devices Agilent Technologies This article needs sources or references that appear in reliable, third-party publications. Alone, primary sources and sources affiliated with the subject of this article are not sufficient for an accurate encyclopedia article. Inc. (NYSE NYSE See: New York Stock Exchange :A) today announced two new CV (capacitance -- voltage) semiconductor process test solutions, developed in cooperation with ACCRETECH, Cascade Microtech Inc. and Micronics Japan. Targeted for next-generation applications, the CV test solutions enable users to optimize the process development and integration of semiconductor wafers, which ultimately enables semiconductor manufacturers to increase test throughput, lower production costs, reduce time to market and improve yield for CMOS devices. The Agilent HF-CV and CV Probing parametric test solutions are complete, integrated products for HF-CV (High Frequency-CV) measurement of ultra-thin gate dielectrics, previously difficult to measure accurately due to leakage current. The Agilent HF-CV solution, designed for the Agilent 4070 Parametric Series, incorporates the core technology of the Agilent 4294A Precision Impedance Analyzer. The CV Probing Solution utilizes the Agilent 4294A Precision Impedance Analyzer and the Agilent 42941A Impedance Probe. The two solutions will cover either high-volume or low-volume testing needs. Using an innovative method, the new CV test solutions give users the ability to measure ultra-thin gate dielectrics, thinner than 100 nm (nanometer), at up to 110 MHz (MegaHertZ) One million cycles per second. It is used to measure the transmission speed of electronic devices, including channels, buses and the computer's internal clock. A one-megahertz clock (1 MHz) means some number of bits (16, 32, 64, etc. for low- and high-volume measurement using fully automated, semi-automated or a manual measurement system. The new Agilent HF-CV solution for the Agilent 4070 Series, integrates the UF300A wafer prober The introduction to this article provides insufficient context for those unfamiliar with the subject matter. Please help [ improve the introduction] to meet Wikipedia's layout standards. You can discuss the issue on the talk page. made by ACCRETECH, a dedicated probe card A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually made by Micronics Japan and the Agilent 4294A Precision Impedance Analyzer and the Agilent 42941A Impedance Probe for high-volume measurements. Using the UF300A, the HF-CV solution provides the capability for automated calibration down to the probe needle tip. The new manual or semi-automated Agilent CV Probing Solution, which is optimized for low-volume measurement, integrates the Cascade Air Coplanar co·pla·nar adj. Lying or occurring in the same plane. Used of points, lines, or figures. co  pla·nar Probe (ACP (Associate Computing Professional) The award for successful completion of an examination in computers offered by the ICCP. It is geared to newcomers in the computing field. For more information, visit www.iccp.org. ACP - Algebra of Communicating Processes ) and the S300 Characterization Probing System made by Cascade Microtech; and the Agilent 4294A Precision Impedance Analyzer and the Agilent 42941A Impedance Probe. "These new solutions reinforce Agilent's commitment to provide our customers with two comprehensive parametric test solutions," said Kazu Nishitsuru, business alignment manager of Agilent's Hachioji Semiconductor Test Division. "We look forward to continuing our joint work with our partners to provide complete solutions that improve quality, reduce time to market, and meet all our customers' testing needs." Agilent Technologies will introduce the Agilent CV parametric test solutions at SEMICON Japan, Chiba, Japan, at booth no. 9-A703. About ACCRETECH ACCRETECH (Tokyo Seimitsu Co., Ltd.) is a leading manufacturer of wafer probing machine. In cooperation with its affiliated company, Accretech Micro Technologies Co., Ltd., ACCRETECH moved into the optical wafer inspection business in 2000 and has been expanding its business activities rapidly. ACCRETECH has also a variety of production lineup for Semiconductor manufacturing such as Wafer Dicing Machine, CMP CMP (cytidine monophosphate): see cytosine. (1) (CMP Media LLC, Manhasset, NY, www.cmp.com) Part of United Business Media, CMP is a leading integrated media company that offers a wide variety of publications and services in the information , Back Grinding Machine and others. The strength of ACCRETECH lies in their motto of "WIN- WIN RELATIONSHIPS CREATE THE WORLD'S No.1 PRODUCTS" including the strategic alliances to develop the competitive product within a short period. For more information about ACCRETECH, please visit www.accretech.jp/english/index.html. About Cascade Microtech, Inc. Cascade Microtech, Inc. is the worldwide leader in providing high frequency and parametric on-wafer test solutions. Engineers use our solutions to test and characterize integrated circuits (ICs) and photonic devices. These devices are then used in semiconductor applications, such as personal computers, servers, cell phones, consumer and automotive electronics, fiber optics fiber optics, transmission of digitized messages or information by light pulses along hair-thin glass fibers. Each fiber is surrounded by a cladding having a high index of refractance so that the light is internally reflected and travels the length of the fiber , PDAs, and other wireless products. Cascade Microtech also produces thin-film probe cards for production-level on-wafer testing of fine pitch, high-speed IC devices for broadband communications and networking, wireless and cell phones as well as other market applications. For more information visit www.cascademicrotech.com. About Micronics Japan Micronics Japan Co., LTD.(MJC MJC Maison de la Jeunesse et de la Culture MJC Meridian Junior College (Singapore) MJC Military Junior College MJC Major Collector (State highway information) MJC Minnesota Judicial Center ) is the worldwide leader in supply of Probe Cards, LCD Probers & TEST contactors for domestic and worldwide markets. We have received high praises from our customers for the reliability of our products and the quality of our service. Information about Micronics (MJC) is available on the Web at http://www.mjc.co.jp/. About Agilent Technologies Agilent Technologies Inc. (NYSE:A) is a global technology leader in communications, electronics and life sciences. The company's 36,000 employees serve customers in more than 120 countries. Agilent had net revenue of $6 billion in fiscal year 2002. Information about Agilent is available on the Web at www.agilent.com. NOTE TO EDITORS: Further technology, corporate citizenship Corporate Citizenship The extent to which businesses are socially responsible in meeting legal, ethical and economic responsibilities placed on them by shareholders. The aim it to create higher standards of living and quality of life in the community in which it operates, while and executive news is available on the Agilent news site at www.agilent.com/go/news. |
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