* Kapoor, Y.M. Division of Agriculture, Natural Sciences and
Mathematics, Lincoln University. STUDY OF THE SMALL ANGLE X-RAY SCATTERING DATA OF SOLIDS WITH TWO LENGTH SCALE STRUCTURE. A technique
has been developed for using small angle x-ray and neutron scattering to
study solids that are composed of systems of interacting scatterers.
These solids have structure on two length scales that normally differ by
a factor of at least 100; average diameters of the systems and the
scatterers. The diameter is defined to be the longest distance
separating two points in a scatterer. The new method makes use of an
equation for analyzing the intensity of the small angle scattering from
systems of interacting scatterers. The equation for the intensity takes
account of the shapes and the diameter distributions of both the systems
and the scatterers. With this technique, structure on length scales from
5 to l0,000 A can be investigated.

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