Browse Scanning electron microscopes topic

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1-35 out of 35 article(s)

Title	Author	Type	Date	Words
Hitachi High-Technologies.		Brief article	Mar 31, 2008	59
JEOL.		Brief article	Mar 31, 2008	69
Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy.	Zhao, Xiaocui; Petersen, Nils O.; Ding, Zhifeng		Mar 1, 2007	6238
All-polymer composites from recycled woven polypropylene fabrics and polyethylene film.	Arnold, J.C.; O'Brien, F.; Moody, M.		Nov 1, 2006	3614
JEOL.		Brief article	Mar 31, 2006	52
Reduction of soil resistance through the use of a composite coating.	Ling, Xiaomei		Oct 1, 2005	3031
A look at transportation forensics.	Ormsby, Clay; Liu, Rongtang		May 1, 2005	3303
Hitachi High-Technologies.		Brief Article	Jan 31, 2005	25
Soluris.		Brief Article	Jan 31, 2005	23
Leica Microsystems introduced the LWM9000 scanning electron microscope (SEM).		Brief Article	Oct 15, 2004	21
Evaluating sources of inclusion defects: SEM-EDS reference data can greatly assist metalcasters in evaluating green sand cast iron inclusion defects and, thus, help create countermeasures to decrease the rate of inclusion errors.	Miyake, H.		Aug 1, 2004	2066
CD-SEM shape-sensitive linewidth measurement final report submitted.		Brief Article	May 1, 2003	121
The analysis of particles at low accelerating voltages ([less than or equal to] 10 kV) with energy dispersive x-ray spectroscopy (EDS).	Small, J.A.		Nov 1, 2002	5733
Newest critical dimension scanning electron microscopes use NIST technology. (News Briefs).		Brief Article	May 1, 2002	89
New photomask designed for SEM magnification calibration. (News Briefs).		Brief Article	Mar 1, 2002	206
Shape-sensitive measurement of nested lines. (News Briefs).		Brief Article	Mar 1, 2002	185
Crystallographic phase analysis of submicrometer particles by electron backscatter diffraction. (New Briefs).		Brief Article	Mar 1, 2002	314
New reference material simplifies SEM performance checks. (News Briefs).		Brief Article	Sep 1, 2001	366
NEW FITTING ALGORITHM FOR SHAPE-SENSITIVE LINEWIDTH METROLOGY.		Brief Article	Jul 1, 2001	322
Izod Impact Strength of a Product Molded of Poly(Vinyl Chloride)/Impact Modifier Containing Voids (Void MOD).	TAKAKI, AKIRA; NARISAWA, IKUO; KURIYAMA, TAKASHI		Mar 1, 2001	3618
Morphology of Polymer Blends in the Melting Section of Co-Rotating Twin Screw Extruders.	POTENTE, H.; BASTIAN, M.; BERGEMANN, K.; SENGE, M.; SCHEEL, G.; WINKELMANN	Statistical Data Included	Feb 1, 2001	4233
SUCCESSFUL ISEMATECH/NIST EXPERIMENT WITH "SHARP-TIP" EMITTERS USED IN CD-SEM.		Brief Article	Nov 1, 2000	121
NIST'S SEMPA FACILITY UPGRADED.		Brief Article	Nov 1, 2000	174
The Izod Impact Strength of Modified Methyl Methacryate/Styrene Copolymer Molding and the Toughening Mechanism.	TAKAKI, AKIRA; YAMAZAKI, KAORU; NARISAWA, IKUO	Brief Article	Feb 1, 2000	2687
The Brittle-Ductile Transition Temperature of Polycarbonate as a Function of Test Speed.	GAYMANS, R. J.; HAMBERG, M. J. J.; INBERG, J. P. F.		Jan 1, 2000	2882
Composites of poly(vinyl acetate) filled with calcium carbonate: microscopy, diffractometry and thermophysical properties.	Kovacevic, Vera; Packham, David; Lucic, Sanja; Hace, Drago; Smit, Ivan		Aug 1, 1999	4638
Comparison of isotactic and syndiotactic polypropylene as matrix materials of hybrid composites.	Stricker, F.; Mulhaupt, R.		Sep 1, 1998	3809
Durability of sheet molding compounds: influence of hydrothermal aging on morphology and molecular mobility at microscopic scale.	Blancon, R.; Martinez-Vega, J.J.; Merle, G.; Revellino, M.; Camino, G.; Polishchuk, A.Ya.; Luda, M.P		Oct 1, 1997	5226
Seeing can be believing.	Holliday, Tom		Feb 1, 1992	443
Tooth-wear gauge opens up dental research.	Bower, Bruce		Feb 16, 1991	750
Unique atomic views from STM's new kin.			Apr 7, 1990	196
Forcing the details of contact charging.	Peterson, I.		Dec 23, 1989	393
Atomic bonds: seeing the links.			Sep 6, 1986	246
Microscope maps miniscule magnetism.	Thomsen, Dietrick E.		Aug 24, 1985	644
Electron tunneling for ultrafine detail.	Thomsen, Dietrick E.		Apr 6, 1985	872