STATS ChipPAC Signs Volume Purchase Agreement with Teradyne for FLEX Test Systems.BOSTON -- Teradyne, Inc. (NYSE NYSE See: New York Stock Exchange :TER Third version. See bis. ) announced today that STATS ChipPAC Ltd, a leading independent semiconductor test and advanced packaging service provider, has selected Teradyne's FLEX(TM) test system as a key platform for testing a wide range of devices for applications including communications, broadband and other consumer electronics. FLEX with microwave capability is already installed at STATS ChipPAC Test Services, the company's elite test facilities in San Diego San Diego (săn dēā`gō), city (1990 pop. 1,110,549), seat of San Diego co., S Calif., on San Diego Bay; inc. 1850. San Diego includes the unincorporated communities of La Jolla and Spring Valley. Coronado is across the bay. and Milpitas, California Milpitas (IPA pronunciation: mɪlpitʌs; inhabitants are called 'Milpitans') is a city in Santa Clara County, California. It is located with San Jose to its south and Fremont to its north, at the eastern end of Highway 237 and generally between Interstate freeways 680 and , as well as STATS ChipPAC's high volume production facilities in Malaysia and Singapore. "As an industry leader in outsourced testing, STATS ChipPAC strives to offer our customers test platforms that cover a broad range of devices while adapting to rapid technology changes," said Han Tiang Fong, Vice President of Test, STATS ChipPAC Ltd. "The strategic decision to work closely with Teradyne to significantly expand our FLEX installed base places STATS ChipPAC in the ready position to support a wide range of customer requirements today while being ready to serve new and emerging market demands." Mark Kelley Mark Kelley is a Canadian journalist. He currently serves as a correspondent and substitute anchor for The National, and was formerly a host of . A graduate of Concordia University in Montreal, the fluently bilingual Kelley began reporting from within Quebec in the 1980's , General Manager, STATS ChipPAC Test Services continued, "Our focus is to provide customers with leading-edge test platforms and the support needed early in the product development cycle. Access to the FLEX in our San Diego and Milpitas test development facilities will help customers achieve their cost objectives and faster time-to-market. Customers are already signing up to use the FLEX for a wide range of requirements from conventional DFT DFT - discrete Fourier transform and structural test to standard analog and complex mixed signal SOCs." Doug Elder, General Manager, Semiconductor Test Business Groups, Teradyne, said, "The selection of FLEX as a future platform of choice by STATS ChipPAC is especially rewarding due to their strong commitment to offering innovative test and advanced packaging technologies to the marketplace. STATS ChipPAC is an industry leader with a commitment to R & D in the test and assembly services industry and Teradyne is very pleased with their decision to invest in the FLEX platform." About FLEX Breaking the cost of test barrier with high-efficiency multi-site test Multi-site test, or "multisite test", or "concurrent test", or "parallel test" are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple "devices" at the same time. while meeting the demands of increasing complexity for an expanding range of devices, FLEX advances multiple test technologies. FLEX spans test requirements from conventional DFT and structural test to standard analog and mixed-signal to complex SOC (System On a Chip) The electronics for a complete, working product contained on a single chip. While a microcontroller includes all the hardware components required to process instructions, an SoC includes the computer and all required ancillary electronics. . Its Tester-per-device-core architecture delivers a complete set of test resources to each device core, with instrument synchronization (1) See synchronous and synchronous transmission. (2) Ensuring that two sets of data are always the same. See data synchronization. (3) Keeping time-of-day clocks in two devices set to the same time. See NTP. and control in device clock time on a vector-by-vector basis. The Universal Slot test head and high-density instrumentation allow easy reconfiguration to changing test needs, and the OpenFLEX open system architecture complements Teradyne's FLEX instrument suite, allowing the addition of focused instruments to further enhance system performance and test economics. To learn more about FLEX, visit http://www.teradyne.com/flex/. About Teradyne Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection in·ter·con·nect v. in·ter·con·nect·ed, in·ter·con·nect·ing, in·ter·con·nects v.intr. To be connected with each other: The two buildings interconnect. v.tr. systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2003, Teradyne had sales of $1.4 billion, and currently employs about 6,300 people worldwide. For more information, visit www.teradyne.com. Teradyne(R) is a registered trademark of Teradyne, Inc. in the US and other countries. All product names are trademarks or registered trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners. |
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