SII NanoTechnology to Release High-performance Fluorescent X-ray Film Thickness Meter.Tokyo, Japan, May 13, 2006 - (JCN JCN Japan Corporate News JCN Journal of Cognitive Neuroscience JCN Journal of Cardiovascular Nursing JCN Journal of Christian Nursing JCN Job Control Number JCN Journal of Child Neurology JCN joint communications network (US DoD) ) - SII SII Servicio de Impuestos Internos (Chile) SII Seiko Instruments, Inc. SII Strong Interest Inventory SII Standards Institution of Israel SII Securities and Investment Institute (UK) NanoTechnology has launched SFT SFT Statens Forurensningstilsyn (Norwegian Pollution Control Authority) SFT System Fault Tolerance SFT Shaft SFT Secure File Transfer SFT School Food Trust (UK) SFT Societe Francaise des Traducteurs 9500, an advanced fluorescent x-ray film thickness-measuring device. This model uses high-intensity x-ray irradiation to measure the thickness of thin and multiplayer membranes. It can also measure the composition of hazardous substances regulated by the RoHS and ELV ELV End-of-Life Vehicles ELV Expendable Launch Vehicle ELV Extra Low Voltage ELV Emission Limit Value (environmental protection) ELV Elektronisches Lastschrift Verfahren (German method of payment) Directives. Supporting Microsoft Word and Excel in standard specifications, the new device facilitates data processing and analysis. The SFT9500 is useful in measuring various metal thin films used in semiconductors, electronic parts and printed circuit boards. The product sells for 14,500,000 yen ($128,300). Copyright [c] 2006 Japan Corporate News Network. All rights reserved. |
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