Research and Markets - Metrology, Inspection and Process Control in VLSI Manufacturing.DUBLIN, Ireland -- Research and Markets (http://www.researchandmarkets.com/reports/c10596) has announced the addition of Metrology, Inspection and Process Control in VLSI VLSI: see integrated circuit. (1) (Very Large Scale Integration) Between 100,000 and one million transistors on a chip. See SSI, MSI, LSI and ULSI. (2) (VLSI Technology, Inc., Tempe, AZ, www.semiconductors. Manufacturing to their offering. Continuous innovations in microelectronics and materials science materials science Study of the properties of solid materials and how those properties are determined by the material's composition and structure, both macroscopic and microscopic. have led to the introduction of a broad array of electronic devices with increasing performance and decreasing size characteristics. Manufacturing these highly engineered products requires complex, multi-stage production processes, increasing the potential for defects and errors associated with equipment failures, contamination of materials, drift in process parameters, human error and other related factors. Manufacturing complexity also increases investment in work-in-progress inventories and lengthens production cycles. To better manage and enhance their yields, manufacturers are increasing their emphasis on automated testing (testing) automated testing - Software testing assisted with software tools that require no operator input, analysis, or evaluation. and inspection at various points in the manufacturing process. As production processes become more complex and reducing material and labor costs become increasingly important, we believe that ongoing yield management provides manufacturers with an important competitive advantage. This report offers a complete analysis of the Process Control market. We follow standard conventions in analysing the market as follows: There are four major sectors -- Lithography Metrology -- Wafer Inspection/Defect Review -- Thin Film Metrology -- Other Process Control Systems Topics Covered Include Microscopy Metrology Ellipsometry Reflectometry Scatterometry Contents Chapter 1: Introduction Chapter 2: Executive Summary Chapter 3: Metrology/Inspection Technologies Chapter 4: Defect Review/Wafer Inspection Chapter 5: Thin Film Metrology Chapter 6: Lithography Metrology Chapter 7: Market Forecast Chapter 8:Integrated/In-Situ Metrology/Inspection Trends Chapter 9: Key Drivers Featured Companies Applied Materials Applied Materials, Inc. NASDAQ: AMAT (HKSE: 4336 ) is the global leader in nanomanufacturing technology solutions with a broad portfolio of innovative equipment, service and software products for the fabrication of semiconductor chips, flat panel solar displays, solar , KLA-Tencor, Leica, JEOL JEOL Japan Electron Optics Laboratory , Hitachi, Carl Zeiss Microelectronic Systems GmbH, Nanometrics, Physical Electronics, Schlumberger, Topcon, Solid State Measurments, Rigaku, Axic, Jipelec, Sentech Instruments GmbH, Secon GmbH, Philips, Jordan Valley Semiconductors Jordan Valley Semiconductors, Inc. is an international scientific instrumentation manufactor which develops and manufactures X-ray fluorescence equipment for use in laboratories and industry plants. Jordan Valley Semiconductors, Inc. , KLA-Tencor, Nanometrics, Aquila Instruments, Leica Microsystems, PHI-Evans, Thermo Nicolet, Accent Optical Technologies, Veeco, SigmaTechm, Timbre timbre Quality of sound that distinguishes one instrument, voice, or other sound source from another. Timbre largely results from a characteristic combination of overtones produced by different instruments. Technologies, TEL TEL Telephone TEL Telegram TEL Telugu (langauge) TEL Terrorist Exclusion List TEL Technology-Enhanced Learning TEL Transporter-Erector-Launcher TEL Tetra-Ethyl Lead TEL Team Deutsche Telekom , Nanometrics, Therma-Wave, Rudolph Technologies, Leica, Lasertec, Lam Research, Nikon, , Accent Optical Technologies, Nova Measuring Instruments Ltd., Carl Zeiss, Topcon, ADE, Inspex, HPL HPL - Language used in HP9825A/S/T "Desktop Calculators", 1978(?) and ported to the early Series 200 family (9826 and 9836, 68000). Fairly simple and standard, but with extensive I/O support for data acquisition and control (BCD, Serial, 16 bit custom and IEEE 488 interfaces), , Holon, Toray Engineering, Sopra, Zygo, Electroglas, Olympus, Seiko, Boxer Cross, Nidek, Horiba Instruments, Dainippon Screen, Tokyo Aircraft Instruments, n&k Technology, August Technology For more information visit http://www.researchandmarkets.com/reports/c10596 |
|
||||||||||||
Printer friendly
Cite/link
Email
Feedback
Reader Opinion