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RAL expands services.


Raytheon's (Lexington, MA) Reliability Analysis Laboratory (RAL 1. RAL - Rutherford Appleton Laboratory (UK).
2. RAL - An expert system.
) has expanded its electronic component analysis services to include more detailed investigations in the areas of materials characterization, non-destructive evaluation and test (NDE/NDT), surface analysis of microprocessors, discrete components, and printed circuit boards (PCBs) and assemblies.

The addition of a new, real-time x-ray system allows the RAL to non-destructively test a variety of miniature parts. Using the system, microelectronic components can be magnified--allowing detailed detection of faults in soldered leads, voids in substrates and die attaches, cracks in ceramics and placement of internal components.

The RAL has also acquired a new energy dispersive dispersive /dis·per·sive/ (-per´siv)
1. tending to become dispersed.

2. promoting dispersion.
 x-ray spectroscopy (EDS (Electronic Data Systems, Plano, TX, www.eds.com) Founded in 1962 by H. Ross Perot (independent candidate for the President of the U.S. in 1992), EDS is the largest outsourcing and data processing services organization in the country. ) system. Able to detect low atomic number elements with high energy resolution, the system provides improved peak overlap identification for more accurate analysis of materials used during the component manufacturing process, including silver, tin and lead. An advanced backscatter backscatter

in radiology, radiation deflected by scattering processes at angles greater than 90 degrees to the original direction of the beam of radiation. Important in radiotherapy when estimating surface exposure dose.
 detector has been added to the RAL's field emission scanning electron microscope scan·ning electron microscope
n. Abbr. SEM
An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and
 (SEM).
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Title Annotation:Raytheon Co. Reliability Analysis Laboratory; Industry News
Publication:Circuits Assembly
Article Type:Brief Article
Date:Sep 1, 2002
Words:156
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