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Browse Probes (Electronic instruments) topic

 

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1-18 out of 18 article(s)
Title Author Type Date Words
Contact: making more accurate measurements: here are some new developments for contact measuring. Vasilash, Gary S. Editorial Jul 1, 2009 794
New probe is capable of operating to 240[degrees]C. Brief article Jul 1, 2007 306
HEKA. Brief article Mar 15, 2007 92
Ocean-sensor project reaches milestone. Perkins, Sid Brief Article Jan 8, 2005 209
Chronos Technology launches SyncWatch. Brief Article Oct 8, 2004 120
The National Magnetic Resonance Facility at Madison located at the University of Wisconsin-Madison installed a Varian 800 MHz Cold Probe. Brief Article Jun 15, 2004 25
Viking Test Services (vikingtest.com) sold an Emma ELX6146 high-speed flying probe tester to Garner Osborne Circuits (gocpcb.co.uk). (It's A Deal). Brief Article Aug 1, 2003 33
High count rate electron probe microanalysis. Herrington, Charles Nov 1, 2002 3199
Decomposition of wavelength dispersive X-Ray spectra. Roques-Carmes, Claude Nov 1, 2002 11622
Barriers to quantitative electron probe x-ray microanalysis for low voltage scanning electron microscopy. Newbury, Dale E. Nov 1, 2002 5435
Sample preparation for electron probe microanalysis--pushing the limits. Engle, Paul D. Nov 1, 2002 4917
Implications of polishing techniques in quantitative x-ray microanalysis. Roques-Carmes, Claude Nov 1, 2002 12326
Non-contact metrology. Stovicek, Donald R. Sep 1, 1993 1295
Innovative probe upgrades CMM. Dec 1, 1992 886
Probing into quality. Stovicek, Donald R. Oct 1, 1992 1716
CMM's abound at Quality-TIME. Jun 1, 1992 2111
Probing for high-precision machining. Jun 1, 1992 1202
Digitizing in 1990. Interview Sep 1, 1990 500

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