Non-contact optical profiler offers non-destructive 3-D measurements.The Xi-100 non-contact optical profiler is highlighted in this four-page, four-color brochure. This non-contact, three-dimensional surface measurement system is said to feature fast, non-destructive measurements, point and shoot operation, high resolution, accuracy and repeatability on smooth or rough surfaces, and is said to be highly affordable. The Xi-100 optical profiler is said to rapidly and quantitatively measure the microscopic microscopic /mi·cro·scop·ic/ (mi?kro-skop´ik) 1. of extremely small size; visible only by the aid of the microscope. 2. pertaining or relating to a microscope or to microscopy. 3-D topography topography (təpŏg`rəfē), description or representation of the features and configuration of land surfaces. Topographic maps use symbols and coloring, with particular attention given to the shape and elevations of terrain. of surfaces. The Xi-100 is said to complement the company's XP Series of stylus-type surface profilers by combining white light and phase-shifting interferometry for precise, non-destructive surface measurements that are internally and permanently referenced to a standard wavelength of light, according to according to prep. 1. As stated or indicated by; on the authority of: according to historians. 2. In keeping with: according to instructions. 3. the literature. The company is said to bring a strong technological emphasis, rigorous attention to quality and superior price/performance value to all the products it offers to meet the critical demands of many surface measurement applications, such as surface roughness, precision step height, surface form and texture, thin film thickness and high resolution surface imaging. The Xi-100 is designed for the researcher who is interested in getting fast, repeatable data from an instrument that is not encumbered Encumbered A property owned by one party on which a second party reserves the right to make a valid claim, e.g., a bank's holding of a home mortgage encumbers property. by unneeded levels of complication complication /com·pli·ca·tion/ (kom?pli-ka´shun) 1. disease(s) concurrent with another disease. 2. occurrence of several diseases in the same patient. com·pli·ca·tion n. , according to the literature. The only instrument adjustments are sample position and focus. The intuitive Windows user interface is said to allow simple and reproducible program navigation. The Xi-100 measures areas as large as 2,016 mm x 2,016 mm. It can also measure smooth surfaces at the nanometer One billionth of a meter. Nanometers are used to measure the wavelengths of light. See angstrom and metric system. level. Ambios Technology www.ambiostech.com |
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