Printer Friendly
The Free Library
23,396,934 articles and books


Nanometrics Introduces Newest Optical CD Metrology Products Enabling Cost-Saving Advanced Process Control.

NanoStation[TM] Remote Analysis Uses Latest Generation RCWA-Based OCD Software

MILPITAS, Calif. -- Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced metrology equipment to the semiconductor industry, today introduced its newest equipment and software products for optical critical dimension (OCD) metrology, a vital need in improving the manufacturability of advanced semiconductor device designs. The new NanoStation system is a remote analysis station incorporating the latest generation rigorous coupled-wave analysis (RCWA)-based OCD software.

The NanoStation features state-of-the-art multi-core CPU technology and Nanometrics' advanced ADAP scatterometry modeling software. It enables process engineers to utilize the full power of OCD measurement technologies, including both normal incidence reflectometry (NI-OCD) and spectroscopic ellipsometry (SE-OCD) methods, and quickly transfer data between Nanometrics' standalone and integrated platforms - Atlas, FLX and 9010 Series systems. Nanometrics has already begun shipping its new NanoStation systems.

"Increased OCD capability is a critical component to an advanced process control (APC) strategy that will help ensure that future semiconductor designs become reality through lower device costs," said David Doyle, director of product marketing at Nanometrics. "Faster validation of structural models and implementation of robust OCD measurement recipes improves statistical process control of key yield-impacting parameters. It reduces time-to-yield, thus lowering device costs."

"Our latest OCD software release has been designed to provide significant advancements in 3-D profile modeling for complex structures required for 45nm and 32nm technology," added Doyle. "The flexibility of both turnkey and software-only solutions enables cost of ownership benefits and ease of deployment to our customers."

About Nanometrics

Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.
COPYRIGHT 2007 Business Wire
No portion of this article can be reproduced without the express written permission from the copyright holder.
Copyright 2007, Gale Group. All rights reserved.

 Reader Opinion

Title:

Comment:



 

Article Details
Printer friendly Cite/link Email Feedback
Publication:Business Wire
Date:Oct 4, 2007
Words:354
Previous Article:McHale Design Launches New Website - Come on, Check It Out.
Next Article:Standard and Poor's Upgrades Fireman's Fund Insurance Company Rating to A+.
Topics:



Related Articles
RIDERS GIVE EmX THUMBS UP.
A new look, a new adventure: you're holding the first complete issue of the new Advocate--an unveiling we've been working toward for many months now.
Dallas completes demo project.
No baling out: even though shredder plants are mushrooming, ferrous cut grades remain in the melt shop mix.
Extrusion tooling.
Temperature controllers.
Metropolitan Realty Associates LLC.
86,000 s/f in deals signed at One Riverfront.

Terms of use | Copyright © 2014 Farlex, Inc. | Feedback | For webmasters